Surface-Enhanced Raman spectroscopy for remote sensing
Publication
, Journal Article
Vo-Dinh, T; Stokes, DL; Miller, GH; Bello, JM; Wachter, EA; Haas, JW; James, DR
Published in: Proceedings of SPIE the International Society for Optical Engineering
December 1, 1990
Conventional Raman spectroscopy is often limited by its low sensitivity due to the inherently weak Raman cross section of organic chemicals. A relatively new detection technique, Surface-Enhanced Raman Scattering (SERS) spectroscopy is based on recent experimental observations, which have indicated enhancement of the Raman scattering efficiency by factors of up to 106 when a compound is adsorbed on rough metallic surfaces that have submicron-scale protrusions. In this report we discuss the development of the SERS technique as a tool for monitoring hazardous chemical emissions and its application to in situ remote sensing.
Duke Scholars
Published In
Proceedings of SPIE the International Society for Optical Engineering
ISSN
0277-786X
Publication Date
December 1, 1990
Volume
1336
Start / End Page
272 / 279
Related Subject Headings
- 5102 Atomic, molecular and optical physics
- 4009 Electronics, sensors and digital hardware
- 4006 Communications engineering
Citation
APA
Chicago
ICMJE
MLA
NLM
Vo-Dinh, T., Stokes, D. L., Miller, G. H., Bello, J. M., Wachter, E. A., Haas, J. W., & James, D. R. (1990). Surface-Enhanced Raman spectroscopy for remote sensing. Proceedings of SPIE the International Society for Optical Engineering, 1336, 272–279.
Vo-Dinh, T., D. L. Stokes, G. H. Miller, J. M. Bello, E. A. Wachter, J. W. Haas, and D. R. James. “Surface-Enhanced Raman spectroscopy for remote sensing.” Proceedings of SPIE the International Society for Optical Engineering 1336 (December 1, 1990): 272–79.
Vo-Dinh T, Stokes DL, Miller GH, Bello JM, Wachter EA, Haas JW, et al. Surface-Enhanced Raman spectroscopy for remote sensing. Proceedings of SPIE the International Society for Optical Engineering. 1990 Dec 1;1336:272–9.
Vo-Dinh, T., et al. “Surface-Enhanced Raman spectroscopy for remote sensing.” Proceedings of SPIE the International Society for Optical Engineering, vol. 1336, Dec. 1990, pp. 272–79.
Vo-Dinh T, Stokes DL, Miller GH, Bello JM, Wachter EA, Haas JW, James DR. Surface-Enhanced Raman spectroscopy for remote sensing. Proceedings of SPIE the International Society for Optical Engineering. 1990 Dec 1;1336:272–279.
Published In
Proceedings of SPIE the International Society for Optical Engineering
ISSN
0277-786X
Publication Date
December 1, 1990
Volume
1336
Start / End Page
272 / 279
Related Subject Headings
- 5102 Atomic, molecular and optical physics
- 4009 Electronics, sensors and digital hardware
- 4006 Communications engineering