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Advances in surface-enhanced Raman spectroscopy for hazardous waste monitoring

Publication ,  Journal Article
Wachter, EA; Haas, JW; James, DR; Gammage, RB; Ferrell, TL; Vo-Dinh, T
Published in: Proceedings of SPIE - The International Society for Optical Engineering
December 1, 1990

Surface-enhanced Raman spectroscopy is being evaluated for use as an advanced method for detecting organic contaminants in groundwater during field-screening of environmental samples. The SERS technique offers attractive and unique capabilities for detecting a wide of organic contaminants in aqueous environments at ppm to ppb levels. An inexpensive computer-controlled portable spectrometer system coupled to a fiberoptic probe has been developed for rapid on-site and in situ determination of organic contamination in groundwater. Applications of recent advances in substrate fabrication for use with environmental samples are discussed, and critical issues pertaining to substrate durability, repeatability, sensitivity, selectivity and universality are addressed.

Duke Scholars

Published In

Proceedings of SPIE - The International Society for Optical Engineering

ISSN

0277-786X

Publication Date

December 1, 1990

Volume

1336

Start / End Page

256 / 262

Related Subject Headings

  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering
 

Citation

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Wachter, E. A., Haas, J. W., James, D. R., Gammage, R. B., Ferrell, T. L., & Vo-Dinh, T. (1990). Advances in surface-enhanced Raman spectroscopy for hazardous waste monitoring. Proceedings of SPIE - The International Society for Optical Engineering, 1336, 256–262.
Wachter, E. A., J. W. Haas, D. R. James, R. B. Gammage, T. L. Ferrell, and T. Vo-Dinh. “Advances in surface-enhanced Raman spectroscopy for hazardous waste monitoring.” Proceedings of SPIE - The International Society for Optical Engineering 1336 (December 1, 1990): 256–62.
Wachter EA, Haas JW, James DR, Gammage RB, Ferrell TL, Vo-Dinh T. Advances in surface-enhanced Raman spectroscopy for hazardous waste monitoring. Proceedings of SPIE - The International Society for Optical Engineering. 1990 Dec 1;1336:256–62.
Wachter, E. A., et al. “Advances in surface-enhanced Raman spectroscopy for hazardous waste monitoring.” Proceedings of SPIE - The International Society for Optical Engineering, vol. 1336, Dec. 1990, pp. 256–62.
Wachter EA, Haas JW, James DR, Gammage RB, Ferrell TL, Vo-Dinh T. Advances in surface-enhanced Raman spectroscopy for hazardous waste monitoring. Proceedings of SPIE - The International Society for Optical Engineering. 1990 Dec 1;1336:256–262.

Published In

Proceedings of SPIE - The International Society for Optical Engineering

ISSN

0277-786X

Publication Date

December 1, 1990

Volume

1336

Start / End Page

256 / 262

Related Subject Headings

  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering