The development and characterization of a dual-energy subtraction imaging system for chest radiography based on CsI:Tl amorphous silicon flat-panel technology
Publication
, Journal Article
Sabol, JM; Avinash, GB; Nicolas, F; Claus, B; Zhao, J; Dobbins, JT
Published in: Proceedings of SPIE- The International Society for Optical Engineering
January 1, 2001
Dual-energy subtraction imaging increases the sensitivity and specificity of pulmonary nodule detection in chest radiography by reducing the contrast of overlying bone structures. A prototype dual-energy system which enables rapid, dual-exposure imaging of the chest using a commercially available high-efficiency, flat-panel x-ray detector was constructed. As such, the quality of the clinical images generated with this prototype exceeds that of CR techniques and demonstrates the potential for improved detection and characterization of lung disease through dual-energy imaging.
Duke Scholars
Published In
Proceedings of SPIE- The International Society for Optical Engineering
DOI
ISSN
0277-786X
Publication Date
January 1, 2001
Volume
4320
Start / End Page
399 / 408
Related Subject Headings
- 5102 Atomic, molecular and optical physics
- 4009 Electronics, sensors and digital hardware
- 4006 Communications engineering
Citation
APA
Chicago
ICMJE
MLA
NLM
Sabol, J. M., Avinash, G. B., Nicolas, F., Claus, B., Zhao, J., & Dobbins, J. T. (2001). The development and characterization of a dual-energy subtraction imaging system for chest radiography based on CsI:Tl amorphous silicon flat-panel technology. Proceedings of SPIE- The International Society for Optical Engineering, 4320, 399–408. https://doi.org/10.1117/12.430897
Sabol, J. M., G. B. Avinash, F. Nicolas, B. Claus, J. Zhao, and J. T. Dobbins. “The development and characterization of a dual-energy subtraction imaging system for chest radiography based on CsI:Tl amorphous silicon flat-panel technology.” Proceedings of SPIE- The International Society for Optical Engineering 4320 (January 1, 2001): 399–408. https://doi.org/10.1117/12.430897.
Sabol JM, Avinash GB, Nicolas F, Claus B, Zhao J, Dobbins JT. The development and characterization of a dual-energy subtraction imaging system for chest radiography based on CsI:Tl amorphous silicon flat-panel technology. Proceedings of SPIE- The International Society for Optical Engineering. 2001 Jan 1;4320:399–408.
Sabol, J. M., et al. “The development and characterization of a dual-energy subtraction imaging system for chest radiography based on CsI:Tl amorphous silicon flat-panel technology.” Proceedings of SPIE- The International Society for Optical Engineering, vol. 4320, Jan. 2001, pp. 399–408. Scopus, doi:10.1117/12.430897.
Sabol JM, Avinash GB, Nicolas F, Claus B, Zhao J, Dobbins JT. The development and characterization of a dual-energy subtraction imaging system for chest radiography based on CsI:Tl amorphous silicon flat-panel technology. Proceedings of SPIE- The International Society for Optical Engineering. 2001 Jan 1;4320:399–408.
Published In
Proceedings of SPIE- The International Society for Optical Engineering
DOI
ISSN
0277-786X
Publication Date
January 1, 2001
Volume
4320
Start / End Page
399 / 408
Related Subject Headings
- 5102 Atomic, molecular and optical physics
- 4009 Electronics, sensors and digital hardware
- 4006 Communications engineering