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Direct measurement of near-band-gap electrorefraction in Al 0.3Ga0.7As/GaAs/Al0.3Ga0.7As thin-film structures

Publication ,  Journal Article
Calhoun, KH; Jokerst, NM
Published in: Applied Physics Letters
December 1, 1993
Published version (DOI)

We report the first direct measurement of near-band-gap Franz-Keldysh electrorefraction in Al0.3Ga0.7As/GaAs/Al 0.3Ga0.7As p-i-n single-crystal thin-film Fabry-Perot structures with semitransparent metallic mirror contacts. These measurements are performed for various reverse biases and at photon energies ranging from 9 to less than 1 meV from the GaAs band edge. The measured refractive index variation is several times larger than that predicted by the effective mass approximation theory.

Duke Scholars

Nan Marie Jokerst
Author Nan Marie Jokerst Electrical and Computer Engineering

Published In

Applied Physics Letters

DOI

10.1063/1.109281

ISSN

0003-6951

Publication Date

December 1, 1993

Volume

62

Issue

21

Start / End Page

2673 / 2675

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences
 

Citation

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Calhoun, K. H., & Jokerst, N. M. (1993). Direct measurement of near-band-gap electrorefraction in Al 0.3Ga0.7As/GaAs/Al0.3Ga0.7As thin-film structures. Applied Physics Letters, 62(21), 2673–2675. https://doi.org/10.1063/1.109281
Calhoun, K. H., and N. M. Jokerst. “Direct measurement of near-band-gap electrorefraction in Al 0.3Ga0.7As/GaAs/Al0.3Ga0.7As thin-film structures.” Applied Physics Letters 62, no. 21 (December 1, 1993): 2673–75. https://doi.org/10.1063/1.109281.
Calhoun KH, Jokerst NM. Direct measurement of near-band-gap electrorefraction in Al 0.3Ga0.7As/GaAs/Al0.3Ga0.7As thin-film structures. Applied Physics Letters. 1993 Dec 1;62(21):2673–5.
Calhoun, K. H., and N. M. Jokerst. “Direct measurement of near-band-gap electrorefraction in Al 0.3Ga0.7As/GaAs/Al0.3Ga0.7As thin-film structures.” Applied Physics Letters, vol. 62, no. 21, Dec. 1993, pp. 2673–75. Scopus, doi:10.1063/1.109281.
Calhoun KH, Jokerst NM. Direct measurement of near-band-gap electrorefraction in Al 0.3Ga0.7As/GaAs/Al0.3Ga0.7As thin-film structures. Applied Physics Letters. 1993 Dec 1;62(21):2673–2675.

Published In

Applied Physics Letters

DOI

10.1063/1.109281

ISSN

0003-6951

Publication Date

December 1, 1993

Volume

62

Issue

21

Start / End Page

2673 / 2675

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences