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Experimental verification of a negative index of refraction.

Publication ,  Journal Article
Shelby, RA; Smith, DR; Schultz, S
Published in: Science (New York, N.Y.)
April 2001

We present experimental scattering data at microwave frequencies on a structured metamaterial that exhibits a frequency band where the effective index of refraction (n) is negative. The material consists of a two-dimensional array of repeated unit cells of copper strips and split ring resonators on interlocking strips of standard circuit board material. By measuring the scattering angle of the transmitted beam through a prism fabricated from this material, we determine the effective n, appropriate to Snell's law. These experiments directly confirm the predictions of Maxwell's equations that n is given by the negative square root of epsilon.mu for the frequencies where both the permittivity (epsilon) and the permeability (mu) are negative. Configurations of geometrical optical designs are now possible that could not be realized by positive index materials.

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Published In

Science (New York, N.Y.)

DOI

EISSN

1095-9203

ISSN

0036-8075

Publication Date

April 2001

Volume

292

Issue

5514

Start / End Page

77 / 79

Related Subject Headings

  • General Science & Technology
 

Citation

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Shelby, R. A., Smith, D. R., & Schultz, S. (2001). Experimental verification of a negative index of refraction. Science (New York, N.Y.), 292(5514), 77–79. https://doi.org/10.1126/science.1058847
Shelby, R. A., D. R. Smith, and S. Schultz. “Experimental verification of a negative index of refraction.Science (New York, N.Y.) 292, no. 5514 (April 2001): 77–79. https://doi.org/10.1126/science.1058847.
Shelby RA, Smith DR, Schultz S. Experimental verification of a negative index of refraction. Science (New York, NY). 2001 Apr;292(5514):77–9.
Shelby, R. A., et al. “Experimental verification of a negative index of refraction.Science (New York, N.Y.), vol. 292, no. 5514, Apr. 2001, pp. 77–79. Epmc, doi:10.1126/science.1058847.
Shelby RA, Smith DR, Schultz S. Experimental verification of a negative index of refraction. Science (New York, NY). 2001 Apr;292(5514):77–79.
Journal cover image

Published In

Science (New York, N.Y.)

DOI

EISSN

1095-9203

ISSN

0036-8075

Publication Date

April 2001

Volume

292

Issue

5514

Start / End Page

77 / 79

Related Subject Headings

  • General Science & Technology