Defect and interface structures of diamond thin films
Publication
, Journal Article
Williams, B; Glass, J; Davis, R
Published in: R and D: Research and Development Kobe Steel Engineering Reports
April 1, 1992
Diamond films grown by microwave plasma CVD have been examined by Transmission Electron Microscopy (TEM) and High Resolution TEM (HRTEM). It was found that columnar growth of polycrystalline grain structure, twins, stacking faults, dislocations and intermediate layers were characteristic of the diamond films.
Duke Scholars
Published In
R and D: Research and Development Kobe Steel Engineering Reports
ISSN
0373-8868
Publication Date
April 1, 1992
Volume
42
Issue
2
Start / End Page
13 / 16
Related Subject Headings
- Materials
Citation
APA
Chicago
ICMJE
MLA
NLM
Williams, B., Glass, J., & Davis, R. (1992). Defect and interface structures of diamond thin films. R and D: Research and Development Kobe Steel Engineering Reports, 42(2), 13–16.
Williams, B., J. Glass, and R. Davis. “Defect and interface structures of diamond thin films.” R and D: Research and Development Kobe Steel Engineering Reports 42, no. 2 (April 1, 1992): 13–16.
Williams B, Glass J, Davis R. Defect and interface structures of diamond thin films. R and D: Research and Development Kobe Steel Engineering Reports. 1992 Apr 1;42(2):13–6.
Williams, B., et al. “Defect and interface structures of diamond thin films.” R and D: Research and Development Kobe Steel Engineering Reports, vol. 42, no. 2, Apr. 1992, pp. 13–16.
Williams B, Glass J, Davis R. Defect and interface structures of diamond thin films. R and D: Research and Development Kobe Steel Engineering Reports. 1992 Apr 1;42(2):13–16.
Published In
R and D: Research and Development Kobe Steel Engineering Reports
ISSN
0373-8868
Publication Date
April 1, 1992
Volume
42
Issue
2
Start / End Page
13 / 16
Related Subject Headings
- Materials