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High sensitivity permeation measurement system for "ultrabarrier" thin films

Publication ,  Journal Article
Zhang, XD; Lewis, JS; Wolter, SD; Parker, CB; Glass, JT
Published in: Journal Of Vacuum Science \& Technology A
2007

The authors demonstrate a new technique for high sensitivity gas permeation measurements by integrating mass spectrometry with programed accumulation, detection, and evacuation of permeant. After passing through the film of interest, the gas permeant is captured and accumulated in an isolated ultrahigh vacuum (UHV) volume. The permeant is then allowed to enter an adjacent residual gas analyzer (RGA) and the resulting partial pressure increase is correlated with the steady state permeation rate. Calibrated results are given for helium and argon permeation through polymer films. The measured detection limits of the system are 1.8 X 10(-4) cm(3)/m(2) day for helium and 2.5 X 10(-4) cm(3)/m(2) day for argon. Both values are several orders of magnitude lower than what is available from commercial instruments or similar RGA-based instruments. Potential applications of this technique include measurement of oxygen and water vapor permeation with sensitivities required for assessment of ultrabarrier coatings. (c) 2007 American Vacuum Society.

Duke Scholars

Published In

Journal Of Vacuum Science \& Technology A

ISSN

0734-2101

Publication Date

2007

Volume

25

Issue

6

Start / End Page

1587 / 1593

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 09 Engineering
  • 02 Physical Sciences
 

Citation

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Zhang, X. D., Lewis, J. S., Wolter, S. D., Parker, C. B., & Glass, J. T. (2007). High sensitivity permeation measurement system for "ultrabarrier" thin films. Journal Of Vacuum Science \& Technology A, 25(6), 1587–1593.
Zhang, X. D., J. S. Lewis, S. D. Wolter, C. B. Parker, and J. T. Glass. “High sensitivity permeation measurement system for "ultrabarrier" thin films.” Journal Of Vacuum Science \& Technology A 25, no. 6 (2007): 1587–93.
Zhang XD, Lewis JS, Wolter SD, Parker CB, Glass JT. High sensitivity permeation measurement system for "ultrabarrier" thin films. Journal Of Vacuum Science \& Technology A. 2007;25(6):1587–93.
Zhang, X. D., et al. “High sensitivity permeation measurement system for "ultrabarrier" thin films.” Journal Of Vacuum Science \& Technology A, vol. 25, no. 6, 2007, pp. 1587–93.
Zhang XD, Lewis JS, Wolter SD, Parker CB, Glass JT. High sensitivity permeation measurement system for "ultrabarrier" thin films. Journal Of Vacuum Science \& Technology A. 2007;25(6):1587–1593.

Published In

Journal Of Vacuum Science \& Technology A

ISSN

0734-2101

Publication Date

2007

Volume

25

Issue

6

Start / End Page

1587 / 1593

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 09 Engineering
  • 02 Physical Sciences