ANALYSIS OF VLSI INTERCONNECT STRUCTURES.
Journal articles
Carin, L; Xu, Q; Webb, KJ; McClintock, JA
Published in: IEEE MTT S International Microwave Symposium Digest
January 1, 1987
A typical VLSI circuit contains a large number of devices with planar metallic interconnects between them. Frequently, these interconnects are in the form of microstrip, analogous to what might be used in a millimeter-wave or microwave integrated circuit. Results of theoretical and experimental studies of the the device interconnect problem are presented. Multiple-line terminated and unterminated problems were treated. Full-wave data for pulse- and time-harmonic propagation are presented. Theoretical and experimental frequency- and time-domain data for the two-line problem are given which include effects of device terminations. These results illustrate the time and spatial coupling phenomena for typical VLSI geometries.
Duke Scholars
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Published In
IEEE MTT S International Microwave Symposium Digest
DOI
ISSN
0149-645X
Publication Date
January 1, 1987
Start / End Page
625 / 628
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Carin, L., Xu, Q., Webb, K. J., & McClintock, J. A. (1987). ANALYSIS OF VLSI INTERCONNECT STRUCTURES. IEEE MTT S International Microwave Symposium Digest, 625–628. https://doi.org/10.1109/mwsym.1987.1132488
Carin, L., Q. Xu, K. J. Webb, and J. A. McClintock. “ANALYSIS OF VLSI INTERCONNECT STRUCTURES.” IEEE MTT S International Microwave Symposium Digest, January 1, 1987, 625–28. https://doi.org/10.1109/mwsym.1987.1132488.
Carin L, Xu Q, Webb KJ, McClintock JA. ANALYSIS OF VLSI INTERCONNECT STRUCTURES. IEEE MTT S International Microwave Symposium Digest. 1987 Jan 1;625–8.
Carin, L., et al. “ANALYSIS OF VLSI INTERCONNECT STRUCTURES.” IEEE MTT S International Microwave Symposium Digest, Jan. 1987, pp. 625–28. Scopus, doi:10.1109/mwsym.1987.1132488.
Carin L, Xu Q, Webb KJ, McClintock JA. ANALYSIS OF VLSI INTERCONNECT STRUCTURES. IEEE MTT S International Microwave Symposium Digest. 1987 Jan 1;625–628.
Published In
IEEE MTT S International Microwave Symposium Digest
DOI
ISSN
0149-645X
Publication Date
January 1, 1987
Start / End Page
625 / 628