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Surface sensitivity of SiON integrated optical waveguides (IOWs) examined by IOW-attenuated total reflection spectrometry and IOW-Raman spectroscopy

Publication ,  Journal Article
Plowman, TE; Garrison, MD; Walker, DS; Reichert, WM
Published in: Thin Solid Films
May 1, 1994

A series of Langmuir-Blodgett (LB) films doped with increasing amounts of lipophilic cyanine dye were deposited at the surface of SiON waveguides. Propagation losses of incoupled laser light were measured photometrically, and then modeled using an attenuated total reflection (ATR) version of the Beer-Lambert law. The SiON waveguides exhibit an experimentally measured surface sensitivity of approximately 0.033 cm-1 propagation loss per 1012 dyes cm-2 and a detection limit of 8.4 × 1011 dyes cm-2. However, the experimental surface sensitivity was 0.4 times less than that predicted by ATR theory that did not account for scatter losses and dye aggregation in the LB film. The discrimination of small signals above background was demonstrated by collecting the integrated optical waveguide Raman spectrum of a submonolayer of avidin bound to the SiON waveguide surface through a biotin linker. This spectrum is believed to be the first spontaneous Raman spectrum reported for a protein film bound to a dielectric substrate. © 1994.

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Published In

Thin Solid Films

DOI

ISSN

0040-6090

Publication Date

May 1, 1994

Volume

243

Issue

1-2

Start / End Page

610 / 615

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences
 

Citation

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Plowman, T. E., Garrison, M. D., Walker, D. S., & Reichert, W. M. (1994). Surface sensitivity of SiON integrated optical waveguides (IOWs) examined by IOW-attenuated total reflection spectrometry and IOW-Raman spectroscopy. Thin Solid Films, 243(1–2), 610–615. https://doi.org/10.1016/0040-6090(93)04168-R
Plowman, T. E., M. D. Garrison, D. S. Walker, and W. M. Reichert. “Surface sensitivity of SiON integrated optical waveguides (IOWs) examined by IOW-attenuated total reflection spectrometry and IOW-Raman spectroscopy.” Thin Solid Films 243, no. 1–2 (May 1, 1994): 610–15. https://doi.org/10.1016/0040-6090(93)04168-R.
Plowman TE, Garrison MD, Walker DS, Reichert WM. Surface sensitivity of SiON integrated optical waveguides (IOWs) examined by IOW-attenuated total reflection spectrometry and IOW-Raman spectroscopy. Thin Solid Films. 1994 May 1;243(1–2):610–5.
Plowman, T. E., et al. “Surface sensitivity of SiON integrated optical waveguides (IOWs) examined by IOW-attenuated total reflection spectrometry and IOW-Raman spectroscopy.” Thin Solid Films, vol. 243, no. 1–2, May 1994, pp. 610–15. Scopus, doi:10.1016/0040-6090(93)04168-R.
Plowman TE, Garrison MD, Walker DS, Reichert WM. Surface sensitivity of SiON integrated optical waveguides (IOWs) examined by IOW-attenuated total reflection spectrometry and IOW-Raman spectroscopy. Thin Solid Films. 1994 May 1;243(1–2):610–615.
Journal cover image

Published In

Thin Solid Films

DOI

ISSN

0040-6090

Publication Date

May 1, 1994

Volume

243

Issue

1-2

Start / End Page

610 / 615

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences