Analysis of conditional MTTF of fault-tolerant systems
Publication
, Journal Article
Choi, H; Wang, W; Trivedi, KS
Published in: Microelectronics Reliability
January 1, 1998
Mean time to failure (MTTF) is one of the most frequently used dependability measures in practice. By convention, MTTF is the expected time for a system to reach any one of the failure states. For some systems, however, the mean time to absorb to a subset of the failure states is of interest. Therefore, the concept of conditional MTTF may well be useful. In this paper, we formalize the definition of conditional MTTF and cumulative conditional MTTF with an efficient computation method in a finite state space Markov model. Analysis of a fault-tolerant disk array system and a fault-tolerant software structure are given to illustrate application of the conditional MTTF. © 1998 Published by Elsevier Science Ltd. All rights reserved.
Duke Scholars
Altmetric Attention Stats
Dimensions Citation Stats
Published In
Microelectronics Reliability
DOI
ISSN
0026-2714
Publication Date
January 1, 1998
Volume
38
Issue
3
Start / End Page
393 / 401
Related Subject Headings
- Applied Physics
- 4009 Electronics, sensors and digital hardware
- 0906 Electrical and Electronic Engineering
Citation
APA
Chicago
ICMJE
MLA
NLM
Choi, H., Wang, W., & Trivedi, K. S. (1998). Analysis of conditional MTTF of fault-tolerant systems. Microelectronics Reliability, 38(3), 393–401. https://doi.org/10.1016/S0026-2714(97)00043-7
Choi, H., W. Wang, and K. S. Trivedi. “Analysis of conditional MTTF of fault-tolerant systems.” Microelectronics Reliability 38, no. 3 (January 1, 1998): 393–401. https://doi.org/10.1016/S0026-2714(97)00043-7.
Choi H, Wang W, Trivedi KS. Analysis of conditional MTTF of fault-tolerant systems. Microelectronics Reliability. 1998 Jan 1;38(3):393–401.
Choi, H., et al. “Analysis of conditional MTTF of fault-tolerant systems.” Microelectronics Reliability, vol. 38, no. 3, Jan. 1998, pp. 393–401. Scopus, doi:10.1016/S0026-2714(97)00043-7.
Choi H, Wang W, Trivedi KS. Analysis of conditional MTTF of fault-tolerant systems. Microelectronics Reliability. 1998 Jan 1;38(3):393–401.
Published In
Microelectronics Reliability
DOI
ISSN
0026-2714
Publication Date
January 1, 1998
Volume
38
Issue
3
Start / End Page
393 / 401
Related Subject Headings
- Applied Physics
- 4009 Electronics, sensors and digital hardware
- 0906 Electrical and Electronic Engineering