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Equating laboratories: Modelling and analysis

Publication ,  Journal Article
Banks, D; Eberhardt, K
Published in: Conference Record - IEEE Instrumentation and Measurement Technology Conference
January 1, 1999

Efficient world trade requires that manufacturers in one country have confidence that their product will meet specifications that are verified by purchasers in another country. But these trading partners rely upon different national metrology laboratories to calibrate their equipment, and there is detectable divergence between their measurement systems. This paper describes statistical methods that enable one to use data from a network of artifact comparisons to estimate the measurement functions at each participating laboratory. These methods cannot determine which laboratory is most accurate, but do allow one to predict the value that a given laboratory would obtain on an artifact from the value measured at another laboratory in the comparison network.

Duke Scholars

Published In

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Publication Date

January 1, 1999

Volume

2

Start / End Page

1099 / 1104
 

Citation

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Banks, D., & Eberhardt, K. (1999). Equating laboratories: Modelling and analysis. Conference Record - IEEE Instrumentation and Measurement Technology Conference, 2, 1099–1104.
Banks, D., and K. Eberhardt. “Equating laboratories: Modelling and analysis.” Conference Record - IEEE Instrumentation and Measurement Technology Conference 2 (January 1, 1999): 1099–1104.
Banks D, Eberhardt K. Equating laboratories: Modelling and analysis. Conference Record - IEEE Instrumentation and Measurement Technology Conference. 1999 Jan 1;2:1099–104.
Banks, D., and K. Eberhardt. “Equating laboratories: Modelling and analysis.” Conference Record - IEEE Instrumentation and Measurement Technology Conference, vol. 2, Jan. 1999, pp. 1099–104.
Banks D, Eberhardt K. Equating laboratories: Modelling and analysis. Conference Record - IEEE Instrumentation and Measurement Technology Conference. 1999 Jan 1;2:1099–1104.

Published In

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Publication Date

January 1, 1999

Volume

2

Start / End Page

1099 / 1104