Correction for specimen movement after acquisition of element-specific electron microprobe images
Publication
, Journal Article
Lamvik, MK; Ingram, P; Menon, RG; Beese, LS; Davilla, SD; LeFurgey, A
Published in: Journal of Microscopy
1989
Duke Scholars
Published In
Journal of Microscopy
ISSN
0022-2720
Publication Date
1989
Volume
156
Issue
2
Start / End Page
183 / 190
Related Subject Headings
- Microscopy
- 0912 Materials Engineering
- 0601 Biochemistry and Cell Biology
- 0204 Condensed Matter Physics
Citation
APA
Chicago
ICMJE
MLA
NLM
Lamvik, M. K., Ingram, P., Menon, R. G., Beese, L. S., Davilla, S. D., & LeFurgey, A. (1989). Correction for specimen movement after acquisition of element-specific electron microprobe images. Journal of Microscopy, 156(2), 183–190.
Lamvik, M. K., P. Ingram, R. G. Menon, L. S. Beese, S. D. Davilla, and A. LeFurgey. “Correction for specimen movement after acquisition of element-specific electron microprobe images.” Journal of Microscopy 156, no. 2 (1989): 183–90.
Lamvik MK, Ingram P, Menon RG, Beese LS, Davilla SD, LeFurgey A. Correction for specimen movement after acquisition of element-specific electron microprobe images. Journal of Microscopy. 1989;156(2):183–90.
Lamvik, M. K., et al. “Correction for specimen movement after acquisition of element-specific electron microprobe images.” Journal of Microscopy, vol. 156, no. 2, 1989, pp. 183–90.
Lamvik MK, Ingram P, Menon RG, Beese LS, Davilla SD, LeFurgey A. Correction for specimen movement after acquisition of element-specific electron microprobe images. Journal of Microscopy. 1989;156(2):183–190.
Published In
Journal of Microscopy
ISSN
0022-2720
Publication Date
1989
Volume
156
Issue
2
Start / End Page
183 / 190
Related Subject Headings
- Microscopy
- 0912 Materials Engineering
- 0601 Biochemistry and Cell Biology
- 0204 Condensed Matter Physics