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Bayesian computations for a class of reliability growth models

Publication ,  Journal Article
Erkanli, A; Mazzuchi, TA; Soyer, R
Published in: Technometrics
January 1, 1998

In this article, we consider the development and analysis of both attribute- and variable-data reliability growth models from a Bayesian perspective. We begin with an overview of a Bayesian attribute-data reliability growth model and illustrate how this model can be extended to cover the variable-data growth models as well. Bayesian analysis of these models requires inference over ordered regions, and even though closed-form results for posterior quantities can be obtained in the attribute-data case, variable-data models prove difficult. In general, when the number of test stages gets large, computations become burdensome and, more importantly, the results may become inaccurate due to computational difficulties. We illustrate how the difficulties in the posterior and predictive analyses can be overcome using Markov-chain Monte Carlo methods. We illustrate the implementation of the proposed models by using examples from both attribute and variable reliability growth data. © 1998 Taylor & Francis Group, LLC.

Duke Scholars

Published In

Technometrics

DOI

EISSN

1537-2723

ISSN

0040-1706

Publication Date

January 1, 1998

Volume

40

Issue

1

Start / End Page

14 / 23

Related Subject Headings

  • Statistics & Probability
  • 4905 Statistics
  • 0104 Statistics
 

Citation

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Chicago
ICMJE
MLA
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Erkanli, A., Mazzuchi, T. A., & Soyer, R. (1998). Bayesian computations for a class of reliability growth models. Technometrics, 40(1), 14–23. https://doi.org/10.1080/00401706.1998.10485478
Erkanli, A., T. A. Mazzuchi, and R. Soyer. “Bayesian computations for a class of reliability growth models.” Technometrics 40, no. 1 (January 1, 1998): 14–23. https://doi.org/10.1080/00401706.1998.10485478.
Erkanli A, Mazzuchi TA, Soyer R. Bayesian computations for a class of reliability growth models. Technometrics. 1998 Jan 1;40(1):14–23.
Erkanli, A., et al. “Bayesian computations for a class of reliability growth models.” Technometrics, vol. 40, no. 1, Jan. 1998, pp. 14–23. Scopus, doi:10.1080/00401706.1998.10485478.
Erkanli A, Mazzuchi TA, Soyer R. Bayesian computations for a class of reliability growth models. Technometrics. 1998 Jan 1;40(1):14–23.

Published In

Technometrics

DOI

EISSN

1537-2723

ISSN

0040-1706

Publication Date

January 1, 1998

Volume

40

Issue

1

Start / End Page

14 / 23

Related Subject Headings

  • Statistics & Probability
  • 4905 Statistics
  • 0104 Statistics