Scholars@Duke publication: TEM analysis of the observed phases during the growth of oriented diamond on nickel substrates

TEM analysis of the observed phases during the growth of oriented diamond on nickel substrates

Publication , Journal Article

Liu, W; Yang, PC; Tucker, DA; Wolden, CA; Davis, RF; Glass, JT; Prater, JT; Sitar, Z

Published in: Materials Research Society Symposium Proceedings

January 1, 1996

Transmission electron microscopy (TEM) was used to investigate the interfacial microstructures and phases involved in the nucleation and growth of the oriented diamond on Ni substrates by a multi-step growth process. A molten surface layer is formed during the process, which appears to be critical for both promotion of the diamond nucleation and suppression of graphite formation. Cross-section TEM analysis revealed that a polycrystalline nickel carbide interfacial structure exists between the diamond particles and the single crystal Ni substrate. X-ray diffraction analysis (XRD) identified the carbide phase as Ni4C. It is suggested that the Ni4C is formed in the molten layer and stabilizes sp³C precursor for diamond nucleation.

Duke Scholars

Author Jeffrey Glass Electrical and Computer Engineering

Published In

Materials Research Society Symposium Proceedings

DOI

10.1557/proc-423-457

ISSN

0272-9172

Publication Date

January 1, 1996

Volume

423

Start / End Page

457 / 462

Citation

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NLM

Liu, W., Yang, P. C., Tucker, D. A., Wolden, C. A., Davis, R. F., Glass, J. T., … Sitar, Z. (1996). TEM analysis of the observed phases during the growth of oriented diamond on nickel substrates. Materials Research Society Symposium Proceedings, 423, 457–462. https://doi.org/10.1557/proc-423-457

Liu, W., P. C. Yang, D. A. Tucker, C. A. Wolden, R. F. Davis, J. T. Glass, J. T. Prater, and Z. Sitar. “TEM analysis of the observed phases during the growth of oriented diamond on nickel substrates.” Materials Research Society Symposium Proceedings 423 (January 1, 1996): 457–62. https://doi.org/10.1557/proc-423-457.

Liu W, Yang PC, Tucker DA, Wolden CA, Davis RF, Glass JT, et al. TEM analysis of the observed phases during the growth of oriented diamond on nickel substrates. Materials Research Society Symposium Proceedings. 1996 Jan 1;423:457–62.

Liu, W., et al. “TEM analysis of the observed phases during the growth of oriented diamond on nickel substrates.” Materials Research Society Symposium Proceedings, vol. 423, Jan. 1996, pp. 457–62. Scopus, doi:10.1557/proc-423-457.

Liu W, Yang PC, Tucker DA, Wolden CA, Davis RF, Glass JT, Prater JT, Sitar Z. TEM analysis of the observed phases during the growth of oriented diamond on nickel substrates. Materials Research Society Symposium Proceedings. 1996 Jan 1;423:457–462.

Published In

Materials Research Society Symposium Proceedings

DOI

10.1557/proc-423-457

ISSN

0272-9172

Publication Date

January 1, 1996

Volume

423

Start / End Page

457 / 462