TEM analysis of the observed phases during the growth of oriented diamond on nickel substrates
Publication
, Journal Article
Liu, W; Yang, PC; Tucker, DA; Wolden, CA; Davis, RF; Glass, JT; Prater, JT; Sitar, Z
Published in: Materials Research Society Symposium - Proceedings
January 1, 1996
Transmission electron microscopy (TEM) was used to investigate the interfacial microstructures and phases involved in the nucleation and growth of the oriented diamond on Ni substrates by a multi-step growth process. A molten surface layer is formed during the process, which appears to be critical for both promotion of the diamond nucleation and suppression of graphite formation. Cross-section TEM analysis revealed that a polycrystalline nickel carbide interfacial structure exists between the diamond particles and the single crystal Ni substrate. X-ray diffraction analysis (XRD) identified the carbide phase as Ni4C. It is suggested that the Ni4C is formed in the molten layer and stabilizes sp3C precursor for diamond nucleation.
Duke Scholars
Published In
Materials Research Society Symposium - Proceedings
DOI
ISSN
0272-9172
Publication Date
January 1, 1996
Volume
423
Start / End Page
457 / 462
Citation
APA
Chicago
ICMJE
MLA
NLM
Liu, W., Yang, P. C., Tucker, D. A., Wolden, C. A., Davis, R. F., Glass, J. T., … Sitar, Z. (1996). TEM analysis of the observed phases during the growth of oriented diamond on nickel substrates. Materials Research Society Symposium - Proceedings, 423, 457–462. https://doi.org/10.1557/proc-423-457
Liu, W., P. C. Yang, D. A. Tucker, C. A. Wolden, R. F. Davis, J. T. Glass, J. T. Prater, and Z. Sitar. “TEM analysis of the observed phases during the growth of oriented diamond on nickel substrates.” Materials Research Society Symposium - Proceedings 423 (January 1, 1996): 457–62. https://doi.org/10.1557/proc-423-457.
Liu W, Yang PC, Tucker DA, Wolden CA, Davis RF, Glass JT, et al. TEM analysis of the observed phases during the growth of oriented diamond on nickel substrates. Materials Research Society Symposium - Proceedings. 1996 Jan 1;423:457–62.
Liu, W., et al. “TEM analysis of the observed phases during the growth of oriented diamond on nickel substrates.” Materials Research Society Symposium - Proceedings, vol. 423, Jan. 1996, pp. 457–62. Scopus, doi:10.1557/proc-423-457.
Liu W, Yang PC, Tucker DA, Wolden CA, Davis RF, Glass JT, Prater JT, Sitar Z. TEM analysis of the observed phases during the growth of oriented diamond on nickel substrates. Materials Research Society Symposium - Proceedings. 1996 Jan 1;423:457–462.
Published In
Materials Research Society Symposium - Proceedings
DOI
ISSN
0272-9172
Publication Date
January 1, 1996
Volume
423
Start / End Page
457 / 462