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Effect of back contact impedance on frequency dependence of capacitance-voltage measurements on metal/diamond diodes

Publication ,  Journal Article
Venkatesan, V; Das, K; Von Windheim, JA; Geis, MW
Published in: Applied Physics Letters
December 1, 1993

Differential capacitance-voltage (C-V) measurements were performed on Al and Pt rectifying contacts fabricated on natural (type IIb) diamonds. The C-V data showed frequency dependence, which decreased significantly after reducing the back contact impedance. The frequency dependence seems primarily to be an effect of the contact capacitance, contact resistance, and bulk resistance of diamond. A model which includes these variables has been proposed to explain this frequency dependence using both large and small back contact impedances.

Duke Scholars

Published In

Applied Physics Letters

DOI

ISSN

0003-6951

Publication Date

December 1, 1993

Volume

63

Issue

8

Start / End Page

1065 / 1067

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences
 

Citation

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Venkatesan, V., Das, K., Von Windheim, J. A., & Geis, M. W. (1993). Effect of back contact impedance on frequency dependence of capacitance-voltage measurements on metal/diamond diodes. Applied Physics Letters, 63(8), 1065–1067. https://doi.org/10.1063/1.109834
Venkatesan, V., K. Das, J. A. Von Windheim, and M. W. Geis. “Effect of back contact impedance on frequency dependence of capacitance-voltage measurements on metal/diamond diodes.” Applied Physics Letters 63, no. 8 (December 1, 1993): 1065–67. https://doi.org/10.1063/1.109834.
Venkatesan V, Das K, Von Windheim JA, Geis MW. Effect of back contact impedance on frequency dependence of capacitance-voltage measurements on metal/diamond diodes. Applied Physics Letters. 1993 Dec 1;63(8):1065–7.
Venkatesan, V., et al. “Effect of back contact impedance on frequency dependence of capacitance-voltage measurements on metal/diamond diodes.” Applied Physics Letters, vol. 63, no. 8, Dec. 1993, pp. 1065–67. Scopus, doi:10.1063/1.109834.
Venkatesan V, Das K, Von Windheim JA, Geis MW. Effect of back contact impedance on frequency dependence of capacitance-voltage measurements on metal/diamond diodes. Applied Physics Letters. 1993 Dec 1;63(8):1065–1067.

Published In

Applied Physics Letters

DOI

ISSN

0003-6951

Publication Date

December 1, 1993

Volume

63

Issue

8

Start / End Page

1065 / 1067

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences