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Discriminative k metrics and the Chan-Vese model for object detection and segmentation

Publication ,  Journal Article
Szlam, A; Sapiro, G
Published in: Proceedings of SPIE - The International Society for Optical Engineering
November 19, 2009

In this work, a modification of the k q-flats framework for pattern classification introduced in [9] is used for pixelwise object detection. We include a preliminary discussion of augmenting this method is with a Chan-Vese-like geometric regularization © 2009 SPIE.

Duke Scholars

Published In

Proceedings of SPIE - The International Society for Optical Engineering

DOI

ISSN

0277-786X

Publication Date

November 19, 2009

Volume

7446

Related Subject Headings

  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering
 

Citation

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Szlam, A., & Sapiro, G. (2009). Discriminative k metrics and the Chan-Vese model for object detection and segmentation. Proceedings of SPIE - The International Society for Optical Engineering, 7446. https://doi.org/10.1117/12.825800
Szlam, A., and G. Sapiro. “Discriminative k metrics and the Chan-Vese model for object detection and segmentation.” Proceedings of SPIE - The International Society for Optical Engineering 7446 (November 19, 2009). https://doi.org/10.1117/12.825800.
Szlam A, Sapiro G. Discriminative k metrics and the Chan-Vese model for object detection and segmentation. Proceedings of SPIE - The International Society for Optical Engineering. 2009 Nov 19;7446.
Szlam, A., and G. Sapiro. “Discriminative k metrics and the Chan-Vese model for object detection and segmentation.” Proceedings of SPIE - The International Society for Optical Engineering, vol. 7446, Nov. 2009. Scopus, doi:10.1117/12.825800.
Szlam A, Sapiro G. Discriminative k metrics and the Chan-Vese model for object detection and segmentation. Proceedings of SPIE - The International Society for Optical Engineering. 2009 Nov 19;7446.

Published In

Proceedings of SPIE - The International Society for Optical Engineering

DOI

ISSN

0277-786X

Publication Date

November 19, 2009

Volume

7446

Related Subject Headings

  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering