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Log-logistic software reliability growth model

Publication ,  Conference
Gokhale, SS; Trivedi, KS
Published in: Proceedings - 3rd IEEE International High-Assurance Systems Engineering Symposium, HASE 1998
January 1, 1998

The finite-failure non-homogeneous Poisson process (NHPP) models proposed in the literature exhibit either constant, monotonic increasing or monotonic decreasing failure occurrence rates per fault, and are inadequate to describe the failure processes underlying certain failure data sets. In this paper, we propose the log-logistic reliability growth model, which can capture the increasing/decreasing nature of the failure occurrence rate per fault. Equations are developed to estimate the parameters of the existing finite-failure NHPP models, as well as the log-logistic model, based on failure data collected in the form of inter-failure times. We also present an analysis of two data sets, where the underlying failure process could not be adequately described by the existing models, which motivated the development of the log-logistic model.

Duke Scholars

Published In

Proceedings - 3rd IEEE International High-Assurance Systems Engineering Symposium, HASE 1998

DOI

Publication Date

January 1, 1998

Volume

1998-November

Start / End Page

34 / 41
 

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Gokhale, S. S., & Trivedi, K. S. (1998). Log-logistic software reliability growth model. In Proceedings - 3rd IEEE International High-Assurance Systems Engineering Symposium, HASE 1998 (Vol. 1998-November, pp. 34–41). https://doi.org/10.1109/HASE.1998.731593
Gokhale, S. S., and K. S. Trivedi. “Log-logistic software reliability growth model.” In Proceedings - 3rd IEEE International High-Assurance Systems Engineering Symposium, HASE 1998, 1998-November:34–41, 1998. https://doi.org/10.1109/HASE.1998.731593.
Gokhale SS, Trivedi KS. Log-logistic software reliability growth model. In: Proceedings - 3rd IEEE International High-Assurance Systems Engineering Symposium, HASE 1998. 1998. p. 34–41.
Gokhale, S. S., and K. S. Trivedi. “Log-logistic software reliability growth model.” Proceedings - 3rd IEEE International High-Assurance Systems Engineering Symposium, HASE 1998, vol. 1998-November, 1998, pp. 34–41. Scopus, doi:10.1109/HASE.1998.731593.
Gokhale SS, Trivedi KS. Log-logistic software reliability growth model. Proceedings - 3rd IEEE International High-Assurance Systems Engineering Symposium, HASE 1998. 1998. p. 34–41.

Published In

Proceedings - 3rd IEEE International High-Assurance Systems Engineering Symposium, HASE 1998

DOI

Publication Date

January 1, 1998

Volume

1998-November

Start / End Page

34 / 41