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Exponential Asymptotics for Thin Film Rupture.

Publication ,  Journal Article
Chapman, SJ; Trinh, PH; Witelski, TP
Published in: SIAM J. Appl. Math.
2013

Duke Scholars

Published In

SIAM J. Appl. Math.

DOI

Publication Date

2013

Volume

73

Start / End Page

232 / 253

Related Subject Headings

  • Applied Mathematics
  • 4901 Applied mathematics
  • 0102 Applied Mathematics
 

Citation

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Chapman, S. J., Trinh, P. H., & Witelski, T. P. (2013). Exponential Asymptotics for Thin Film Rupture. SIAM J. Appl. Math., 73, 232–253. https://doi.org/10.1137/120872012
Chapman, S Jonathan, Philippe H. Trinh, and Thomas P. Witelski. “Exponential Asymptotics for Thin Film Rupture.SIAM J. Appl. Math. 73 (2013): 232–53. https://doi.org/10.1137/120872012.
Chapman SJ, Trinh PH, Witelski TP. Exponential Asymptotics for Thin Film Rupture. SIAM J Appl Math. 2013;73:232–53.
Chapman, S. Jonathan, et al. “Exponential Asymptotics for Thin Film Rupture.SIAM J. Appl. Math., vol. 73, 2013, pp. 232–53. Dblp, doi:10.1137/120872012.
Chapman SJ, Trinh PH, Witelski TP. Exponential Asymptotics for Thin Film Rupture. SIAM J Appl Math. 2013;73:232–253.

Published In

SIAM J. Appl. Math.

DOI

Publication Date

2013

Volume

73

Start / End Page

232 / 253

Related Subject Headings

  • Applied Mathematics
  • 4901 Applied mathematics
  • 0102 Applied Mathematics