ITR: Nanoarchitecture: Balancing Regularity, Complexity, and Defect Tolerance using DNA for Nanoeletronic Integration
Awarded By
Contributors
- LaBean, Thomas Co Investigator
- Lebeck, Alvin R. Principal Investigator
- Liu, Jie Co Investigator
- Reif, John H. Co Investigator
- Sorin, Daniel J. Co Investigator
Start/End
- September 15, 2003 - August 31, 2007