Skip to main content

Architecting a common-source-line array for bipolar non-volatile memory devices

Publication ,  Conference
Zhao, B; Yang, J; Zhang, Y; Chen, Y; Li, H
Published in: Proceedings -Design, Automation and Test in Europe, DATE
May 24, 2012

Traditional array organization of bipolar non-volatile memories such as STT-MRAM and memristor utilizes two bitlines for cell manipulations. With technology scaling, such bitline pair will soon become the bottleneck of density improvement. In this paper we propose a novel common-source-line array architecture, which uses a shared source-line along the row, leaving only one bitline per column. We also elaborate our design flow towards a reliable common-source-line array design, and demonstrate its effectiveness on STT-MRAM and memristor memory arrays. Our study results show that with comparable latency and energy, the proposed common-source-line array can save 33% and 21.8% area for Memristor-RAM and STT-MRAM respectively, comparing with corresponding traditional dual-bitline array designs. © 2012 EDAA.

Duke Scholars

Published In

Proceedings -Design, Automation and Test in Europe, DATE

ISSN

1530-1591

ISBN

9783981080186

Publication Date

May 24, 2012

Start / End Page

1451 / 1454
 

Citation

APA
Chicago
ICMJE
MLA
NLM
Zhao, B., Yang, J., Zhang, Y., Chen, Y., & Li, H. (2012). Architecting a common-source-line array for bipolar non-volatile memory devices. In Proceedings -Design, Automation and Test in Europe, DATE (pp. 1451–1454).
Zhao, B., J. Yang, Y. Zhang, Y. Chen, and H. Li. “Architecting a common-source-line array for bipolar non-volatile memory devices.” In Proceedings -Design, Automation and Test in Europe, DATE, 1451–54, 2012.
Zhao B, Yang J, Zhang Y, Chen Y, Li H. Architecting a common-source-line array for bipolar non-volatile memory devices. In: Proceedings -Design, Automation and Test in Europe, DATE. 2012. p. 1451–4.
Zhao, B., et al. “Architecting a common-source-line array for bipolar non-volatile memory devices.” Proceedings -Design, Automation and Test in Europe, DATE, 2012, pp. 1451–54.
Zhao B, Yang J, Zhang Y, Chen Y, Li H. Architecting a common-source-line array for bipolar non-volatile memory devices. Proceedings -Design, Automation and Test in Europe, DATE. 2012. p. 1451–1454.

Published In

Proceedings -Design, Automation and Test in Europe, DATE

ISSN

1530-1591

ISBN

9783981080186

Publication Date

May 24, 2012

Start / End Page

1451 / 1454