Noise macromodel for radio frequency integrated circuits
Publication
, Conference
Xu, Y; Li, X; Li, P; Pileggi, L
Published in: Proceedings -Design, Automation and Test in Europe, DATE
December 1, 2003
Noise performance is a critical analog and RF circuit design constraint, and can impact the selection of the IC system-level architecture. It is therefore imperative that some model of the noise is represented at the highest levels of abstraction during the design process. In this paper we propose a noise macromodel for analog circuits and demonstrate it by way of implementation in a system level simulator based on MATLAB. We also explain our process of macromodel extraction via reformulation of frequency-domain noise analysis results, and the corresponding steps of model order reduction. The results demonstrate the efficacy of this macromodel for frequency domain system level simulation. © 2003 IEEE.
Duke Scholars
Published In
Proceedings -Design, Automation and Test in Europe, DATE
DOI
ISSN
1530-1591
Publication Date
December 1, 2003
Start / End Page
150 / 155
Citation
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MLA
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Xu, Y., Li, X., Li, P., & Pileggi, L. (2003). Noise macromodel for radio frequency integrated circuits. In Proceedings -Design, Automation and Test in Europe, DATE (pp. 150–155). https://doi.org/10.1109/DATE.2003.1253601
Xu, Y., X. Li, P. Li, and L. Pileggi. “Noise macromodel for radio frequency integrated circuits.” In Proceedings -Design, Automation and Test in Europe, DATE, 150–55, 2003. https://doi.org/10.1109/DATE.2003.1253601.
Xu Y, Li X, Li P, Pileggi L. Noise macromodel for radio frequency integrated circuits. In: Proceedings -Design, Automation and Test in Europe, DATE. 2003. p. 150–5.
Xu, Y., et al. “Noise macromodel for radio frequency integrated circuits.” Proceedings -Design, Automation and Test in Europe, DATE, 2003, pp. 150–55. Scopus, doi:10.1109/DATE.2003.1253601.
Xu Y, Li X, Li P, Pileggi L. Noise macromodel for radio frequency integrated circuits. Proceedings -Design, Automation and Test in Europe, DATE. 2003. p. 150–155.
Published In
Proceedings -Design, Automation and Test in Europe, DATE
DOI
ISSN
1530-1591
Publication Date
December 1, 2003
Start / End Page
150 / 155