Noise macromodel for radio frequency integrated circuits
Publication
, Conference
Xu, Y; Li, X; Li, P; Pileggi, L
Published in: Proceedings Design Automation and Test in Europe Date
December 1, 2003
Noise performance is a critical analog and RF circuit design constraint, and can impact the selection of the IC system-level architecture. It is therefore imperative that some model of the noise is represented at the highest levels of abstraction during the design process. In this paper we propose a noise macromodel for analog circuits and demonstrate it by way of implementation in a system level simulator based on MATLAB. We also explain our process of macromodel extraction via reformulation of frequency-domain noise analysis results, and the corresponding steps of model order reduction. The results demonstrate the efficacy of this macromodel for frequency domain system level simulation. © 2003 IEEE.
Duke Scholars
Published In
Proceedings Design Automation and Test in Europe Date
DOI
ISSN
1530-1591
Publication Date
December 1, 2003
Start / End Page
150 / 155
Citation
APA
Chicago
ICMJE
MLA
NLM
Xu, Y., Li, X., Li, P., & Pileggi, L. (2003). Noise macromodel for radio frequency integrated circuits. In Proceedings Design Automation and Test in Europe Date (pp. 150–155). https://doi.org/10.1109/DATE.2003.1253601
Xu, Y., X. Li, P. Li, and L. Pileggi. “Noise macromodel for radio frequency integrated circuits.” In Proceedings Design Automation and Test in Europe Date, 150–55, 2003. https://doi.org/10.1109/DATE.2003.1253601.
Xu Y, Li X, Li P, Pileggi L. Noise macromodel for radio frequency integrated circuits. In: Proceedings Design Automation and Test in Europe Date. 2003. p. 150–5.
Xu, Y., et al. “Noise macromodel for radio frequency integrated circuits.” Proceedings Design Automation and Test in Europe Date, 2003, pp. 150–55. Scopus, doi:10.1109/DATE.2003.1253601.
Xu Y, Li X, Li P, Pileggi L. Noise macromodel for radio frequency integrated circuits. Proceedings Design Automation and Test in Europe Date. 2003. p. 150–155.
Published In
Proceedings Design Automation and Test in Europe Date
DOI
ISSN
1530-1591
Publication Date
December 1, 2003
Start / End Page
150 / 155