ECT failure rate among specific devices.
Journal Article (Letter)
Full Text
Duke Authors
Cited Authors
- Swartz, CM
Published Date
- June 2001
Published In
Volume / Issue
- 158 / 6
Start / End Page
- 973 - 974
PubMed ID
- 11384928
International Standard Serial Number (ISSN)
- 0002-953X
Digital Object Identifier (DOI)
- 10.1176/appi.ajp.158.6.973
Language
- eng
Conference Location
- United States