ECT failure rate among specific devices.

Published

Journal Article (Letter)

Full Text

Duke Authors

Cited Authors

  • Swartz, CM

Published Date

  • June 2001

Published In

Volume / Issue

  • 158 / 6

Start / End Page

  • 973 - 974

PubMed ID

  • 11384928

Pubmed Central ID

  • 11384928

International Standard Serial Number (ISSN)

  • 0002-953X

Digital Object Identifier (DOI)

  • 10.1176/appi.ajp.158.6.973

Language

  • eng

Conference Location

  • United States