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A tandem SIMS study of poly(vinyl methyl ether)

Publication ,  Journal Article
Leggett, GJ; Chilkoti, A; Ratner, BD; Vickerman, JC
Published in: Surface and Interface Analysis
January 1, 1992

Results are presented for a tandem‐SIMS investigation of the fragmentation patterns of secondary ions sputtered from the surface of poly(vinyl methyl ether) (PVME). A complete fragmentation sequence is deduced which is capable of explaining the formation of most of the major ions observed in the SIMS spectrum in terms of fragmentation steps proceeding from the largest secondary ion observed. The fragmentation steps involved in the formation of these ions are discussed and the secondary ion structures are identified. Copyright © 1992 John Wiley & Sons Ltd.

Duke Scholars

Published In

Surface and Interface Analysis

DOI

EISSN

1096-9918

ISSN

0142-2421

Publication Date

January 1, 1992

Volume

18

Issue

3

Start / End Page

210 / 216

Related Subject Headings

  • Applied Physics
  • 5104 Condensed matter physics
  • 4018 Nanotechnology
  • 0306 Physical Chemistry (incl. Structural)
  • 0204 Condensed Matter Physics
 

Citation

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ICMJE
MLA
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Leggett, G. J., Chilkoti, A., Ratner, B. D., & Vickerman, J. C. (1992). A tandem SIMS study of poly(vinyl methyl ether). Surface and Interface Analysis, 18(3), 210–216. https://doi.org/10.1002/sia.740180306
Leggett, G. J., A. Chilkoti, B. D. Ratner, and J. C. Vickerman. “A tandem SIMS study of poly(vinyl methyl ether).” Surface and Interface Analysis 18, no. 3 (January 1, 1992): 210–16. https://doi.org/10.1002/sia.740180306.
Leggett GJ, Chilkoti A, Ratner BD, Vickerman JC. A tandem SIMS study of poly(vinyl methyl ether). Surface and Interface Analysis. 1992 Jan 1;18(3):210–6.
Leggett, G. J., et al. “A tandem SIMS study of poly(vinyl methyl ether).” Surface and Interface Analysis, vol. 18, no. 3, Jan. 1992, pp. 210–16. Scopus, doi:10.1002/sia.740180306.
Leggett GJ, Chilkoti A, Ratner BD, Vickerman JC. A tandem SIMS study of poly(vinyl methyl ether). Surface and Interface Analysis. 1992 Jan 1;18(3):210–216.
Journal cover image

Published In

Surface and Interface Analysis

DOI

EISSN

1096-9918

ISSN

0142-2421

Publication Date

January 1, 1992

Volume

18

Issue

3

Start / End Page

210 / 216

Related Subject Headings

  • Applied Physics
  • 5104 Condensed matter physics
  • 4018 Nanotechnology
  • 0306 Physical Chemistry (incl. Structural)
  • 0204 Condensed Matter Physics