A tandem SIMS study of poly(vinyl methyl ether)
Publication
, Journal Article
Leggett, GJ; Chilkoti, A; Ratner, BD; Vickerman, JC
Published in: Surface and Interface Analysis
January 1, 1992
Results are presented for a tandem‐SIMS investigation of the fragmentation patterns of secondary ions sputtered from the surface of poly(vinyl methyl ether) (PVME). A complete fragmentation sequence is deduced which is capable of explaining the formation of most of the major ions observed in the SIMS spectrum in terms of fragmentation steps proceeding from the largest secondary ion observed. The fragmentation steps involved in the formation of these ions are discussed and the secondary ion structures are identified. Copyright © 1992 John Wiley & Sons Ltd.
Duke Scholars
Published In
Surface and Interface Analysis
DOI
EISSN
1096-9918
ISSN
0142-2421
Publication Date
January 1, 1992
Volume
18
Issue
3
Start / End Page
210 / 216
Related Subject Headings
- Applied Physics
- 5104 Condensed matter physics
- 4018 Nanotechnology
- 0306 Physical Chemistry (incl. Structural)
- 0204 Condensed Matter Physics
Citation
APA
Chicago
ICMJE
MLA
NLM
Leggett, G. J., Chilkoti, A., Ratner, B. D., & Vickerman, J. C. (1992). A tandem SIMS study of poly(vinyl methyl ether). Surface and Interface Analysis, 18(3), 210–216. https://doi.org/10.1002/sia.740180306
Leggett, G. J., A. Chilkoti, B. D. Ratner, and J. C. Vickerman. “A tandem SIMS study of poly(vinyl methyl ether).” Surface and Interface Analysis 18, no. 3 (January 1, 1992): 210–16. https://doi.org/10.1002/sia.740180306.
Leggett GJ, Chilkoti A, Ratner BD, Vickerman JC. A tandem SIMS study of poly(vinyl methyl ether). Surface and Interface Analysis. 1992 Jan 1;18(3):210–6.
Leggett, G. J., et al. “A tandem SIMS study of poly(vinyl methyl ether).” Surface and Interface Analysis, vol. 18, no. 3, Jan. 1992, pp. 210–16. Scopus, doi:10.1002/sia.740180306.
Leggett GJ, Chilkoti A, Ratner BD, Vickerman JC. A tandem SIMS study of poly(vinyl methyl ether). Surface and Interface Analysis. 1992 Jan 1;18(3):210–216.
Published In
Surface and Interface Analysis
DOI
EISSN
1096-9918
ISSN
0142-2421
Publication Date
January 1, 1992
Volume
18
Issue
3
Start / End Page
210 / 216
Related Subject Headings
- Applied Physics
- 5104 Condensed matter physics
- 4018 Nanotechnology
- 0306 Physical Chemistry (incl. Structural)
- 0204 Condensed Matter Physics