Behaviors of multi-dimensional forgetting memristor models
Publication
, Conference
Chen, L; Liu, Z; Li, C; Wu, J; Chen, J; Chen, Y
Published in: Proceedings IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society
December 15, 2017
This letter discusses behaviors of multi-dimensional memristor models. A second dimensional memristor model is extracted from the third dimensional memristor model. Parameters of this memristor model are physically defined and analyzed. A comparison between the first, the second and the third dimensional models is taken. The effect of the diffusion term on five typical window functions is analyzed. Besides, we provide a visual interface to exhibit these memristor properties.
Duke Scholars
Published In
Proceedings IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society
DOI
ISBN
9781538611272
Publication Date
December 15, 2017
Volume
2017-January
Start / End Page
7417 / 7421
Citation
APA
Chicago
ICMJE
MLA
NLM
Chen, L., Liu, Z., Li, C., Wu, J., Chen, J., & Chen, Y. (2017). Behaviors of multi-dimensional forgetting memristor models. In Proceedings IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society (Vol. 2017-January, pp. 7417–7421). https://doi.org/10.1109/IECON.2017.8217299
Chen, L., Z. Liu, C. Li, J. Wu, J. Chen, and Y. Chen. “Behaviors of multi-dimensional forgetting memristor models.” In Proceedings IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, 2017-January:7417–21, 2017. https://doi.org/10.1109/IECON.2017.8217299.
Chen L, Liu Z, Li C, Wu J, Chen J, Chen Y. Behaviors of multi-dimensional forgetting memristor models. In: Proceedings IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society. 2017. p. 7417–21.
Chen, L., et al. “Behaviors of multi-dimensional forgetting memristor models.” Proceedings IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, vol. 2017-January, 2017, pp. 7417–21. Scopus, doi:10.1109/IECON.2017.8217299.
Chen L, Liu Z, Li C, Wu J, Chen J, Chen Y. Behaviors of multi-dimensional forgetting memristor models. Proceedings IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society. 2017. p. 7417–7421.
Published In
Proceedings IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society
DOI
ISBN
9781538611272
Publication Date
December 15, 2017
Volume
2017-January
Start / End Page
7417 / 7421