Behaviors of multi-dimensional forgetting memristor models
Publication
, Conference
Chen, L; Liu, Z; Li, C; Wu, J; Chen, J; Chen, Y
Published in: Proceedings IECON 2017 43rd Annual Conference of the IEEE Industrial Electronics Society
December 15, 2017
This letter discusses behaviors of multi-dimensional memristor models. A second dimensional memristor model is extracted from the third dimensional memristor model. Parameters of this memristor model are physically defined and analyzed. A comparison between the first, the second and the third dimensional models is taken. The effect of the diffusion term on five typical window functions is analyzed. Besides, we provide a visual interface to exhibit these memristor properties.
Duke Scholars
Published In
Proceedings IECON 2017 43rd Annual Conference of the IEEE Industrial Electronics Society
DOI
Publication Date
December 15, 2017
Volume
2017-January
Start / End Page
7417 / 7421
Citation
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Chen, L., Liu, Z., Li, C., Wu, J., Chen, J., & Chen, Y. (2017). Behaviors of multi-dimensional forgetting memristor models. In Proceedings IECON 2017 43rd Annual Conference of the IEEE Industrial Electronics Society (Vol. 2017-January, pp. 7417–7421). https://doi.org/10.1109/IECON.2017.8217299
Chen, L., Z. Liu, C. Li, J. Wu, J. Chen, and Y. Chen. “Behaviors of multi-dimensional forgetting memristor models.” In Proceedings IECON 2017 43rd Annual Conference of the IEEE Industrial Electronics Society, 2017-January:7417–21, 2017. https://doi.org/10.1109/IECON.2017.8217299.
Chen L, Liu Z, Li C, Wu J, Chen J, Chen Y. Behaviors of multi-dimensional forgetting memristor models. In: Proceedings IECON 2017 43rd Annual Conference of the IEEE Industrial Electronics Society. 2017. p. 7417–21.
Chen, L., et al. “Behaviors of multi-dimensional forgetting memristor models.” Proceedings IECON 2017 43rd Annual Conference of the IEEE Industrial Electronics Society, vol. 2017-January, 2017, pp. 7417–21. Scopus, doi:10.1109/IECON.2017.8217299.
Chen L, Liu Z, Li C, Wu J, Chen J, Chen Y. Behaviors of multi-dimensional forgetting memristor models. Proceedings IECON 2017 43rd Annual Conference of the IEEE Industrial Electronics Society. 2017. p. 7417–7421.
Published In
Proceedings IECON 2017 43rd Annual Conference of the IEEE Industrial Electronics Society
DOI
Publication Date
December 15, 2017
Volume
2017-January
Start / End Page
7417 / 7421