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Oxide precipitation at silicon grain boundaries

Publication ,  Journal Article
Schroer, E; Hopfe, S; Werner, P; Gösele, U; Duscher, G; Rühle, M; Tan, TY
Published in: Applied Physics Letters
January 20, 1997

Oxygen precipitates at various grain boundaries in crystalline silicon, formed after prolonged high temperature annealing, grow within a narrow size distribution. This narrow size distribution appears to depend on the specific grain boundary. On the basis of this observation a model is derived which is based on the energy balance between grain boundary energy, Si/SiO2 interface energy, and an additional term describing the energy of the ledges of the faceted precipitates. This model predicts an energy minimum for a defined size of the precipitates. © 1997 American Institute of Physics.

Duke Scholars

Published In

Applied Physics Letters

DOI

ISSN

0003-6951

Publication Date

January 20, 1997

Volume

70

Issue

3

Start / End Page

327 / 329

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences
 

Citation

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Schroer, E., Hopfe, S., Werner, P., Gösele, U., Duscher, G., Rühle, M., & Tan, T. Y. (1997). Oxide precipitation at silicon grain boundaries. Applied Physics Letters, 70(3), 327–329. https://doi.org/10.1063/1.118405
Schroer, E., S. Hopfe, P. Werner, U. Gösele, G. Duscher, M. Rühle, and T. Y. Tan. “Oxide precipitation at silicon grain boundaries.” Applied Physics Letters 70, no. 3 (January 20, 1997): 327–29. https://doi.org/10.1063/1.118405.
Schroer E, Hopfe S, Werner P, Gösele U, Duscher G, Rühle M, et al. Oxide precipitation at silicon grain boundaries. Applied Physics Letters. 1997 Jan 20;70(3):327–9.
Schroer, E., et al. “Oxide precipitation at silicon grain boundaries.” Applied Physics Letters, vol. 70, no. 3, Jan. 1997, pp. 327–29. Scopus, doi:10.1063/1.118405.
Schroer E, Hopfe S, Werner P, Gösele U, Duscher G, Rühle M, Tan TY. Oxide precipitation at silicon grain boundaries. Applied Physics Letters. 1997 Jan 20;70(3):327–329.

Published In

Applied Physics Letters

DOI

ISSN

0003-6951

Publication Date

January 20, 1997

Volume

70

Issue

3

Start / End Page

327 / 329

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences