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Determining thickness independently from optical constants using ultrafast spectral interferometry

Publication ,  Journal Article
Huang, F; Federici, JF; Gary, D; Jedju, T; Warren, WS
Published in: 2005 Conference on Lasers and Electro-Optics, CLEO
December 1, 2005

We show that the application of ultrafast techniques, specially femtosecond lasers, allow simultaneous measurements of material thickness and optical constants from transmission measurements using a frequency interferometer. © 2005 Optical Society of America.

Duke Scholars

Published In

2005 Conference on Lasers and Electro-Optics, CLEO

Publication Date

December 1, 2005

Volume

2

Start / End Page

1103 / 1105
 

Citation

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MLA
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Huang, F., Federici, J. F., Gary, D., Jedju, T., & Warren, W. S. (2005). Determining thickness independently from optical constants using ultrafast spectral interferometry. 2005 Conference on Lasers and Electro-Optics, CLEO, 2, 1103–1105.
Huang, F., J. F. Federici, D. Gary, T. Jedju, and W. S. Warren. “Determining thickness independently from optical constants using ultrafast spectral interferometry.” 2005 Conference on Lasers and Electro-Optics, CLEO 2 (December 1, 2005): 1103–5.
Huang F, Federici JF, Gary D, Jedju T, Warren WS. Determining thickness independently from optical constants using ultrafast spectral interferometry. 2005 Conference on Lasers and Electro-Optics, CLEO. 2005 Dec 1;2:1103–5.
Huang, F., et al. “Determining thickness independently from optical constants using ultrafast spectral interferometry.” 2005 Conference on Lasers and Electro-Optics, CLEO, vol. 2, Dec. 2005, pp. 1103–05.
Huang F, Federici JF, Gary D, Jedju T, Warren WS. Determining thickness independently from optical constants using ultrafast spectral interferometry. 2005 Conference on Lasers and Electro-Optics, CLEO. 2005 Dec 1;2:1103–1105.

Published In

2005 Conference on Lasers and Electro-Optics, CLEO

Publication Date

December 1, 2005

Volume

2

Start / End Page

1103 / 1105