Determining thickness independently from optical constants using ultrafast spectral interferometry
Publication
, Journal Article
Huang, F; Federici, JF; Gary, D; Jedju, T; Warren, WS
Published in: 2005 Conference on Lasers and Electro Optics CLEO
December 1, 2005
We show that the application of ultrafast techniques, specially femtosecond lasers, allow simultaneous measurements of material thickness and optical constants from transmission measurements using a frequency interferometer. © 2005 Optical Society of America.
Duke Scholars
Published In
2005 Conference on Lasers and Electro Optics CLEO
Publication Date
December 1, 2005
Volume
2
Start / End Page
1103 / 1105
Citation
APA
Chicago
ICMJE
MLA
NLM
Huang, F., Federici, J. F., Gary, D., Jedju, T., & Warren, W. S. (2005). Determining thickness independently from optical constants using ultrafast spectral interferometry. 2005 Conference on Lasers and Electro Optics CLEO, 2, 1103–1105.
Huang, F., J. F. Federici, D. Gary, T. Jedju, and W. S. Warren. “Determining thickness independently from optical constants using ultrafast spectral interferometry.” 2005 Conference on Lasers and Electro Optics CLEO 2 (December 1, 2005): 1103–5.
Huang F, Federici JF, Gary D, Jedju T, Warren WS. Determining thickness independently from optical constants using ultrafast spectral interferometry. 2005 Conference on Lasers and Electro Optics CLEO. 2005 Dec 1;2:1103–5.
Huang, F., et al. “Determining thickness independently from optical constants using ultrafast spectral interferometry.” 2005 Conference on Lasers and Electro Optics CLEO, vol. 2, Dec. 2005, pp. 1103–05.
Huang F, Federici JF, Gary D, Jedju T, Warren WS. Determining thickness independently from optical constants using ultrafast spectral interferometry. 2005 Conference on Lasers and Electro Optics CLEO. 2005 Dec 1;2:1103–1105.
Published In
2005 Conference on Lasers and Electro Optics CLEO
Publication Date
December 1, 2005
Volume
2
Start / End Page
1103 / 1105