Band alignment at the Cu2 ZnSn (Sx Se1-x ) 4 /CdS interface
Energy band alignments between CdS and Cu2 ZnSn (S xSe1-x) 4 (CZTSSe) grown via solution-based and vacuum-based deposition routes were studied as a function of the [S] / [S+Se] ratio with femtosecond laser ultraviolet photoelectron spectroscopy, photoluminescence, medium energy ion scattering, and secondary ion mass spectrometry. Band bending in the underlying CZTSSe layer was measured via pump/probe photovoltage shifts of the photoelectron spectra and offsets were determined with photoemission under flat band conditions. Increasing the S content of the CZTSSe films produces a valence edge shift to higher binding energy and increases the CZTSSe band gap. In all cases, the CdS conduction band offsets were spikes. © 2011 American Institute of Physics.
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Citation
Published In
DOI
ISSN
Publication Date
Volume
Issue
Related Subject Headings
- Applied Physics
- 51 Physical sciences
- 40 Engineering
- 10 Technology
- 09 Engineering
- 02 Physical Sciences