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Mechanical effects of galvanic corrosion of thin film polysilicon

Publication ,  Conference
Miller, DC; Gall, K; Stoldt, CR
Published in: American Society of Mechanical Engineers Micro Electro Mechanical Systems Division Publications MEMS
December 1, 2005

Mechanical, and electrical effects generated by the galvanic corrosion of polysilicon immersed in various hydrofluoric acid (HF)-based solutions are described. Micromachined test structures consisting of phosphorus-doped polysilicon in contact with a gold metallization layer are utilized. A suite of otherwise identical test (metal added) and reference (no metal) structures were used to investigate changes in key performance parameters. Corroded test structures demonstrate an increase in through-thickness strain gradient, a decrease in the characteristic frequency of mechanical resonance, no change in in-plane strain, greatly increased electrical resistance, a decrease in hardness, and a decrease in elastic modulus. Noteworthy results were observed for aqueous- hydrochloric acid, ethanol, water, ammonium fluoride (found in buffered oxide etchant), Triton-X-100, as well as vapor-HF based chemistries. This first systematic study validates preliminary experiments and demonstrates the impact of corrosion on miniaturized structures, indicating a potential influence upon the material properties, design, performance, fatigue, tribology (friction/ wear), manufacture, and packaging of micro- and nano-scale devices. Copyright © 2005 by ASME.

Duke Scholars

Published In

American Society of Mechanical Engineers Micro Electro Mechanical Systems Division Publications MEMS

DOI

ISSN

1096-665X

Publication Date

December 1, 2005

Volume

7 MEMS

Start / End Page

325 / 334
 

Citation

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Miller, D. C., Gall, K., & Stoldt, C. R. (2005). Mechanical effects of galvanic corrosion of thin film polysilicon. In American Society of Mechanical Engineers Micro Electro Mechanical Systems Division Publications MEMS (Vol. 7 MEMS, pp. 325–334). https://doi.org/10.1115/IMECE2005-79295
Miller, D. C., K. Gall, and C. R. Stoldt. “Mechanical effects of galvanic corrosion of thin film polysilicon.” In American Society of Mechanical Engineers Micro Electro Mechanical Systems Division Publications MEMS, 7 MEMS:325–34, 2005. https://doi.org/10.1115/IMECE2005-79295.
Miller DC, Gall K, Stoldt CR. Mechanical effects of galvanic corrosion of thin film polysilicon. In: American Society of Mechanical Engineers Micro Electro Mechanical Systems Division Publications MEMS. 2005. p. 325–34.
Miller, D. C., et al. “Mechanical effects of galvanic corrosion of thin film polysilicon.” American Society of Mechanical Engineers Micro Electro Mechanical Systems Division Publications MEMS, vol. 7 MEMS, 2005, pp. 325–34. Scopus, doi:10.1115/IMECE2005-79295.
Miller DC, Gall K, Stoldt CR. Mechanical effects of galvanic corrosion of thin film polysilicon. American Society of Mechanical Engineers Micro Electro Mechanical Systems Division Publications MEMS. 2005. p. 325–334.

Published In

American Society of Mechanical Engineers Micro Electro Mechanical Systems Division Publications MEMS

DOI

ISSN

1096-665X

Publication Date

December 1, 2005

Volume

7 MEMS

Start / End Page

325 / 334