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Routine monitoring of the electrocardiogram Q-T interval in the EEG laboratory

Publication ,  Journal Article
Gospe, SM
Published in: American Journal of EEG Technology
January 1, 1992

Patients with prolongation of the Q-T interval of the electrocardiogram are at risk for ventricular tachyarrhythmias which can lead to severe neurologic morbidity and mortality secondary to cerebral ischemia. Since these patients may present with seizures or syncope, they frequently receive their first diagnostic evaluation through the EEG laboratory. Electrocardiographic monitoring during an EEG examination is a simple and common practice but analysis for possible prolongation of the Q-T interval is not routinely performed. This paper discusses the importance and methodology of measuring the electrocardiogram Q-T interval on records obtained in the EEG laboratory.

Duke Scholars

Published In

American Journal of EEG Technology

DOI

ISSN

0002-9238

Publication Date

January 1, 1992

Volume

32

Issue

1

Start / End Page

58 / 64
 

Citation

APA
Chicago
ICMJE
MLA
NLM
Gospe, S. M. (1992). Routine monitoring of the electrocardiogram Q-T interval in the EEG laboratory. American Journal of EEG Technology, 32(1), 58–64. https://doi.org/10.1080/00029238.1992.11080392
Gospe, S. M. “Routine monitoring of the electrocardiogram Q-T interval in the EEG laboratory.” American Journal of EEG Technology 32, no. 1 (January 1, 1992): 58–64. https://doi.org/10.1080/00029238.1992.11080392.
Gospe SM. Routine monitoring of the electrocardiogram Q-T interval in the EEG laboratory. American Journal of EEG Technology. 1992 Jan 1;32(1):58–64.
Gospe, S. M. “Routine monitoring of the electrocardiogram Q-T interval in the EEG laboratory.” American Journal of EEG Technology, vol. 32, no. 1, Jan. 1992, pp. 58–64. Scopus, doi:10.1080/00029238.1992.11080392.
Gospe SM. Routine monitoring of the electrocardiogram Q-T interval in the EEG laboratory. American Journal of EEG Technology. 1992 Jan 1;32(1):58–64.

Published In

American Journal of EEG Technology

DOI

ISSN

0002-9238

Publication Date

January 1, 1992

Volume

32

Issue

1

Start / End Page

58 / 64