An overview of non-volatile memory technology and the implication for tools and architectures
Publication
, Conference
Hai, L; Yiran, C
Published in: Proceedings Design Automation and Test in Europe Date
October 22, 2009
Novel nonvolatile memory technologies are gaining significant attentions from semiconductor industry in the competition of universal memory development. We used Spin-Transfer Torque Random Access Memory (STT-RAM) and Resistive Random Access Memory (R-RAM) as examples to discuss the implication of emerging nonvolatile memory for tools and architectures. Three aspects, including device and memory cell modeling, device/circuit co-design consideration and novel memory architecture, are discussed in details. The goal of these discussions is to design a high-density, low-power, highperformance nonvolatile memory with simple architecture and minimized circuit design complexity. © 2009 EDAA.
Duke Scholars
Published In
Proceedings Design Automation and Test in Europe Date
ISSN
1530-1591
Publication Date
October 22, 2009
Start / End Page
731 / 736
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Hai, L., & Yiran, C. (2009). An overview of non-volatile memory technology and the implication for tools and architectures. In Proceedings Design Automation and Test in Europe Date (pp. 731–736).
Hai, L., and C. Yiran. “An overview of non-volatile memory technology and the implication for tools and architectures.” In Proceedings Design Automation and Test in Europe Date, 731–36, 2009.
Hai L, Yiran C. An overview of non-volatile memory technology and the implication for tools and architectures. In: Proceedings Design Automation and Test in Europe Date. 2009. p. 731–6.
Hai, L., and C. Yiran. “An overview of non-volatile memory technology and the implication for tools and architectures.” Proceedings Design Automation and Test in Europe Date, 2009, pp. 731–36.
Hai L, Yiran C. An overview of non-volatile memory technology and the implication for tools and architectures. Proceedings Design Automation and Test in Europe Date. 2009. p. 731–736.
Published In
Proceedings Design Automation and Test in Europe Date
ISSN
1530-1591
Publication Date
October 22, 2009
Start / End Page
731 / 736