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PS3-RAM: A fast portable and scalable statistical STT-RAM reliability analysis method

Publication ,  Conference
Wen, W; Zhang, Y; Chen, Y; Wang, Y; Xie, Y
Published in: Proceedings - Design Automation Conference
July 11, 2012

Process variations and thermal fluctuations significantly affect the write reliability of spin-transfer torque random access memory (STT-RAM). Traditionally, modeling the impacts of these variations on STT-RAM designs requires expensive Monte-Carlo runs with hybrid magnetic-CMOS simulation steps. In this paper, we propose a fast and scalable semi-analytical simulation method - PS3-RAM, for STT-RAM write reliability analysis. Simulation results show that PS3-RAM offers excellent agreement with the conventional simulation method without running the costly macro-magnetic and SPICE simulations. Our method can accurately estimate the STT-RAM write error rate at both MTJ switching directions under different temperatures while receiving a speedup of multiple orders of magnitude (five order or more). PS3-RAM shows great potentials in the STT-RAM reliability analysis at the early design stage of memory or micro-architecture. © 2012 ACM.

Duke Scholars

Published In

Proceedings - Design Automation Conference

DOI

ISSN

0738-100X

Publication Date

July 11, 2012

Start / End Page

1191 / 1196
 

Citation

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Wen, W., Zhang, Y., Chen, Y., Wang, Y., & Xie, Y. (2012). PS3-RAM: A fast portable and scalable statistical STT-RAM reliability analysis method. In Proceedings - Design Automation Conference (pp. 1191–1196). https://doi.org/10.1145/2228360.2228580
Wen, W., Y. Zhang, Y. Chen, Y. Wang, and Y. Xie. “PS3-RAM: A fast portable and scalable statistical STT-RAM reliability analysis method.” In Proceedings - Design Automation Conference, 1191–96, 2012. https://doi.org/10.1145/2228360.2228580.
Wen W, Zhang Y, Chen Y, Wang Y, Xie Y. PS3-RAM: A fast portable and scalable statistical STT-RAM reliability analysis method. In: Proceedings - Design Automation Conference. 2012. p. 1191–6.
Wen, W., et al. “PS3-RAM: A fast portable and scalable statistical STT-RAM reliability analysis method.” Proceedings - Design Automation Conference, 2012, pp. 1191–96. Scopus, doi:10.1145/2228360.2228580.
Wen W, Zhang Y, Chen Y, Wang Y, Xie Y. PS3-RAM: A fast portable and scalable statistical STT-RAM reliability analysis method. Proceedings - Design Automation Conference. 2012. p. 1191–1196.

Published In

Proceedings - Design Automation Conference

DOI

ISSN

0738-100X

Publication Date

July 11, 2012

Start / End Page

1191 / 1196