Modeling Random Telegraph Noise as a Randomness Source and its Application in True Random Number Generation
Publication
, Journal Article
Chen, X; Wang, L; Li, B; Wang, Y; Li, X; Liu, Y; Yang, H
Published in: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
September 1, 2016
The random telegraph noise (RTN) is becoming more serious in advanced technologies. Due to the unpredictability of the physical phenomenon, RTN is a good randomness source for true random number generators (TRNG). In this paper, we build fundamental randomness models for TRNGs based on single trap-and multiple traps-induced RTN. We theoretically derive the autocorrelation coefficient, bias, and bit rate for RTN-based TRNGs. Two representative RTN-based TRNG schemes are simulated to verify the proposed randomness models. An oscillator-based TRNG is also studied based on the theoretical randomness model of multiple traps-induced RTN. We also provide basic guidelines for designing RTN-based TRNGs.
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Published In
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI
ISSN
0278-0070
Publication Date
September 1, 2016
Volume
35
Issue
9
Start / End Page
1435 / 1448
Related Subject Headings
- Computer Hardware & Architecture
- 4607 Graphics, augmented reality and games
- 4009 Electronics, sensors and digital hardware
- 1006 Computer Hardware
- 0906 Electrical and Electronic Engineering
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Chen, X., Wang, L., Li, B., Wang, Y., Li, X., Liu, Y., & Yang, H. (2016). Modeling Random Telegraph Noise as a Randomness Source and its Application in True Random Number Generation. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 35(9), 1435–1448. https://doi.org/10.1109/TCAD.2015.2511074
Chen, X., L. Wang, B. Li, Y. Wang, X. Li, Y. Liu, and H. Yang. “Modeling Random Telegraph Noise as a Randomness Source and its Application in True Random Number Generation.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 35, no. 9 (September 1, 2016): 1435–48. https://doi.org/10.1109/TCAD.2015.2511074.
Chen X, Wang L, Li B, Wang Y, Li X, Liu Y, et al. Modeling Random Telegraph Noise as a Randomness Source and its Application in True Random Number Generation. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 2016 Sep 1;35(9):1435–48.
Chen, X., et al. “Modeling Random Telegraph Noise as a Randomness Source and its Application in True Random Number Generation.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 35, no. 9, Sept. 2016, pp. 1435–48. Scopus, doi:10.1109/TCAD.2015.2511074.
Chen X, Wang L, Li B, Wang Y, Li X, Liu Y, Yang H. Modeling Random Telegraph Noise as a Randomness Source and its Application in True Random Number Generation. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 2016 Sep 1;35(9):1435–1448.
Published In
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI
ISSN
0278-0070
Publication Date
September 1, 2016
Volume
35
Issue
9
Start / End Page
1435 / 1448
Related Subject Headings
- Computer Hardware & Architecture
- 4607 Graphics, augmented reality and games
- 4009 Electronics, sensors and digital hardware
- 1006 Computer Hardware
- 0906 Electrical and Electronic Engineering