Modeling local variation of low-frequency noise in MOSFETs via sum of lognormal random variables
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Yu, B; Li, X; Yonemura, J; Wu, Z; Goo, JS; Thuruthiyil, C; Icel, A
Published in: Proceedings of the Custom Integrated Circuits Conference
November 26, 2012
In this paper, we investigate the geometry dependence for the local variation of low-frequency noise in MOSFETs via the sum of lognormal random variables. A compact model has been developed and applied to the measured data with excellent match, and therefore enables the coverage of low-frequency noise statistics in circuit design. © 2012 IEEE.
Duke Scholars
Published In
Proceedings of the Custom Integrated Circuits Conference
DOI
ISSN
0886-5930
Publication Date
November 26, 2012
Citation
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Chicago
ICMJE
MLA
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Yu, B., Li, X., Yonemura, J., Wu, Z., Goo, J. S., Thuruthiyil, C., & Icel, A. (2012). Modeling local variation of low-frequency noise in MOSFETs via sum of lognormal random variables. In Proceedings of the Custom Integrated Circuits Conference. https://doi.org/10.1109/CICC.2012.6330573
Yu, B., X. Li, J. Yonemura, Z. Wu, J. S. Goo, C. Thuruthiyil, and A. Icel. “Modeling local variation of low-frequency noise in MOSFETs via sum of lognormal random variables.” In Proceedings of the Custom Integrated Circuits Conference, 2012. https://doi.org/10.1109/CICC.2012.6330573.
Yu B, Li X, Yonemura J, Wu Z, Goo JS, Thuruthiyil C, et al. Modeling local variation of low-frequency noise in MOSFETs via sum of lognormal random variables. In: Proceedings of the Custom Integrated Circuits Conference. 2012.
Yu, B., et al. “Modeling local variation of low-frequency noise in MOSFETs via sum of lognormal random variables.” Proceedings of the Custom Integrated Circuits Conference, 2012. Scopus, doi:10.1109/CICC.2012.6330573.
Yu B, Li X, Yonemura J, Wu Z, Goo JS, Thuruthiyil C, Icel A. Modeling local variation of low-frequency noise in MOSFETs via sum of lognormal random variables. Proceedings of the Custom Integrated Circuits Conference. 2012.
Published In
Proceedings of the Custom Integrated Circuits Conference
DOI
ISSN
0886-5930
Publication Date
November 26, 2012