Large-scale analog/RF performance modeling by statistical regression

In this paper, we introduce several large-scale modeling techniques to analyze the high-dimensional, strongly-nonlinear performance variability observed in nanoscale manufacturing technologies. Our goal is to solve a large number of (e.g., 1044-106) model coefficients from a small set of (e.g., 102-103) sampling points without overfitting. This is facilitated by exploiting the underlying sparsity of model coefficients. Our circuit example designed in a commercial 65nm process demonstrates that the proposed techniques achieve 25x speedup compared with the traditional response surface modeling. ©2009 IEEE.

Duke Scholars

Author Xin Li Electrical and Computer Engineering