Parameter extracttion for the PSP MOSFET model by the combination of genetic and levenberg-marquardt algorithms
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Zhou, Q; Yao, W; Wu, W; Li, X; Zhu, Z; Gildenblat, G
Published in: IEEE International Conference on Microelectronic Test Structures
July 15, 2009
Based on the combination of the genetic and Levenberg-Marquardt algorithms, a new method is developed to perform both local and global parameter extraction for the PSP MOSFET model. It has been successfully used to extract parameter sets for a 65-nm technology node. Numerical examples demonstrate its ability to obtain highly accurate model parameter values without excessive computational cost.
Duke Scholars
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IEEE International Conference on Microelectronic Test Structures
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Publication Date
July 15, 2009
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137 / 142
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Zhou, Q., Yao, W., Wu, W., Li, X., Zhu, Z., & Gildenblat, G. (2009). Parameter extracttion for the PSP MOSFET model by the combination of genetic and levenberg-marquardt algorithms. In IEEE International Conference on Microelectronic Test Structures (pp. 137–142). https://doi.org/10.1109/ICMTS.2009.4814627
Zhou, Q., W. Yao, W. Wu, X. Li, Z. Zhu, and G. Gildenblat. “Parameter extracttion for the PSP MOSFET model by the combination of genetic and levenberg-marquardt algorithms.” In IEEE International Conference on Microelectronic Test Structures, 137–42, 2009. https://doi.org/10.1109/ICMTS.2009.4814627.
Zhou Q, Yao W, Wu W, Li X, Zhu Z, Gildenblat G. Parameter extracttion for the PSP MOSFET model by the combination of genetic and levenberg-marquardt algorithms. In: IEEE International Conference on Microelectronic Test Structures. 2009. p. 137–42.
Zhou, Q., et al. “Parameter extracttion for the PSP MOSFET model by the combination of genetic and levenberg-marquardt algorithms.” IEEE International Conference on Microelectronic Test Structures, 2009, pp. 137–42. Scopus, doi:10.1109/ICMTS.2009.4814627.
Zhou Q, Yao W, Wu W, Li X, Zhu Z, Gildenblat G. Parameter extracttion for the PSP MOSFET model by the combination of genetic and levenberg-marquardt algorithms. IEEE International Conference on Microelectronic Test Structures. 2009. p. 137–142.
Published In
IEEE International Conference on Microelectronic Test Structures
DOI
Publication Date
July 15, 2009
Start / End Page
137 / 142