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Extensions to backward propagation of variance for statistical modeling

Publication ,  Journal Article
McAndrew, CC; Li, X; Stevanović, I; Gildenblat, G
Published in: IEEE Design and Test of Computers
March 1, 2010
Published version (DOI)

Editor's note: Correlating the statistics of process parameters with the statistics of electrical performance is a vital task in statistical modeling. This article describes a more general form of the backward propagation of variance (BPV) method, a numerical technique for iteratively solving the statistics of process parameters from the statistics of electrical performance within the behavior of models encapsulated in Spice. © 2010 IEEE.

Duke Scholars

Xin Li
Author Xin Li Electrical and Computer Engineering

Published In

IEEE Design and Test of Computers

DOI

10.1109/MDT.2010.44

ISSN

0740-7475

Publication Date

March 1, 2010

Volume

27

Issue

2

Start / End Page

36 / 43

Related Subject Headings

  • Computer Hardware & Architecture
  • 1006 Computer Hardware
  • 0906 Electrical and Electronic Engineering
 

Citation

APA
Chicago
ICMJE
MLA
NLM
McAndrew, C. C., Li, X., Stevanović, I., & Gildenblat, G. (2010). Extensions to backward propagation of variance for statistical modeling. IEEE Design and Test of Computers, 27(2), 36–43. https://doi.org/10.1109/MDT.2010.44
McAndrew, C. C., X. Li, I. Stevanović, and G. Gildenblat. “Extensions to backward propagation of variance for statistical modeling.” IEEE Design and Test of Computers 27, no. 2 (March 1, 2010): 36–43. https://doi.org/10.1109/MDT.2010.44.
McAndrew CC, Li X, Stevanović I, Gildenblat G. Extensions to backward propagation of variance for statistical modeling. IEEE Design and Test of Computers. 2010 Mar 1;27(2):36–43.
McAndrew, C. C., et al. “Extensions to backward propagation of variance for statistical modeling.” IEEE Design and Test of Computers, vol. 27, no. 2, Mar. 2010, pp. 36–43. Scopus, doi:10.1109/MDT.2010.44.
McAndrew CC, Li X, Stevanović I, Gildenblat G. Extensions to backward propagation of variance for statistical modeling. IEEE Design and Test of Computers. 2010 Mar 1;27(2):36–43.

Published In

IEEE Design and Test of Computers

DOI

10.1109/MDT.2010.44

ISSN

0740-7475

Publication Date

March 1, 2010

Volume

27

Issue

2

Start / End Page

36 / 43

Related Subject Headings

  • Computer Hardware & Architecture
  • 1006 Computer Hardware
  • 0906 Electrical and Electronic Engineering