(Invited) the new CMC standard compact MOS model PSP: Advantages for RF applications
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Schölten, AJ; Smit, GDJ; De Vries, BA; Tiemeijer, LF; Croon, JA; Klaassen, DBM; Van Langevelde, R; Li, X; Wu, W; Gildenblat, G
Published in: Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium
September 22, 2008
First the surface-potential-based compact MOS model, PSP, is introduced. After a discussion of the general advantages of this model, it is benchmarked against measurements from the 45 nm technology node. Finally, we zoom in on the modeling in PSP of two effects that are of special importance for RF applications: distortion and noise. © 2008 IEEE.
Duke Scholars
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Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium
DOI
ISSN
1529-2517
Publication Date
September 22, 2008
Start / End Page
247 / 250
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Schölten, A. J., Smit, G. D. J., De Vries, B. A., Tiemeijer, L. F., Croon, J. A., Klaassen, D. B. M., … Gildenblat, G. (2008). (Invited) the new CMC standard compact MOS model PSP: Advantages for RF applications. In Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium (pp. 247–250). https://doi.org/10.1109/RFIC.2008.4561428
Schölten, A. J., G. D. J. Smit, B. A. De Vries, L. F. Tiemeijer, J. A. Croon, D. B. M. Klaassen, R. Van Langevelde, X. Li, W. Wu, and G. Gildenblat. “(Invited) the new CMC standard compact MOS model PSP: Advantages for RF applications.” In Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium, 247–50, 2008. https://doi.org/10.1109/RFIC.2008.4561428.
Schölten AJ, Smit GDJ, De Vries BA, Tiemeijer LF, Croon JA, Klaassen DBM, et al. (Invited) the new CMC standard compact MOS model PSP: Advantages for RF applications. In: Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium. 2008. p. 247–50.
Schölten, A. J., et al. “(Invited) the new CMC standard compact MOS model PSP: Advantages for RF applications.” Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium, 2008, pp. 247–50. Scopus, doi:10.1109/RFIC.2008.4561428.
Schölten AJ, Smit GDJ, De Vries BA, Tiemeijer LF, Croon JA, Klaassen DBM, Van Langevelde R, Li X, Wu W, Gildenblat G. (Invited) the new CMC standard compact MOS model PSP: Advantages for RF applications. Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium. 2008. p. 247–250.
Published In
Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium
DOI
ISSN
1529-2517
Publication Date
September 22, 2008
Start / End Page
247 / 250