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Improving Diagnostic Resolution of Failing ICs Through Learning

Publication ,  Journal Article
Xue, Y; Li, X; Blanton, RD
Published in: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
June 1, 2018

Diagnosis is the first analysis step for uncovering the root cause of failure for a defective integrated logic circuit. The conventional objective of identifying failure locations has been augmented with various physically-aware diagnosis techniques that are intended to improve both resolution and accuracy. Despite these advances, it is often the case, however, that resolution, i.e., the number of locations or candidates reported by diagnosis, exceeds the number of actual failing locations. To address this major challenge, a novel, machine-learning-based resolution improvement methodology named physically-aware diagnostic resolution enhancement (PADRE) is described. PADRE uses easily-available tester and simulation data to extract features that uniquely characterize each candidate. PADRE applies machine learning to the features to identify candidates that correspond to the actual failure locations. Through various experiments, PADRE is shown to significantly improve resolution with virtually no negative impact on accuracy. Additional experiments demonstrate that PADRE is robust against data set variation and feature-data availability.

Duke Scholars

Published In

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

DOI

ISSN

0278-0070

Publication Date

June 1, 2018

Volume

37

Issue

6

Start / End Page

1288 / 1297

Related Subject Headings

  • Computer Hardware & Architecture
  • 4607 Graphics, augmented reality and games
  • 4009 Electronics, sensors and digital hardware
  • 1006 Computer Hardware
  • 0906 Electrical and Electronic Engineering
 

Citation

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Xue, Y., Li, X., & Blanton, R. D. (2018). Improving Diagnostic Resolution of Failing ICs Through Learning. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 37(6), 1288–1297. https://doi.org/10.1109/TCAD.2016.2611499
Xue, Y., X. Li, and R. D. Blanton. “Improving Diagnostic Resolution of Failing ICs Through Learning.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 37, no. 6 (June 1, 2018): 1288–97. https://doi.org/10.1109/TCAD.2016.2611499.
Xue Y, Li X, Blanton RD. Improving Diagnostic Resolution of Failing ICs Through Learning. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 2018 Jun 1;37(6):1288–97.
Xue, Y., et al. “Improving Diagnostic Resolution of Failing ICs Through Learning.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 37, no. 6, June 2018, pp. 1288–97. Scopus, doi:10.1109/TCAD.2016.2611499.
Xue Y, Li X, Blanton RD. Improving Diagnostic Resolution of Failing ICs Through Learning. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 2018 Jun 1;37(6):1288–1297.

Published In

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

DOI

ISSN

0278-0070

Publication Date

June 1, 2018

Volume

37

Issue

6

Start / End Page

1288 / 1297

Related Subject Headings

  • Computer Hardware & Architecture
  • 4607 Graphics, augmented reality and games
  • 4009 Electronics, sensors and digital hardware
  • 1006 Computer Hardware
  • 0906 Electrical and Electronic Engineering