
A phase space model of Fourier ptychographic microscopy.
A new computational imaging technique, termed Fourier ptychographic microscopy (FPM), uses a sequence of low-resolution images captured under varied illumination to iteratively converge upon a high-resolution complex sample estimate. Here, we propose a mathematical model of FPM that explicitly connects its operation to conventional ptychography, a common procedure applied to electron and X-ray diffractive imaging. Our mathematical framework demonstrates that under ideal illumination conditions, conventional ptychography and FPM both produce datasets that are mathematically linked by a linear transformation. We hope this finding encourages the future cross-pollination of ideas between two otherwise unconnected experimental imaging procedures. In addition, the coherence state of the illumination source used by each imaging platform is critical to successful operation, yet currently not well understood. We apply our mathematical framework to demonstrate that partial coherence uniquely alters both conventional ptychography's and FPM's captured data, but up to a certain threshold can still lead to accurate resolution-enhanced imaging through appropriate computational post-processing. We verify this theoretical finding through simulation and experiment.
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Related Subject Headings
- Optics
- Models, Theoretical
- Microscopy
- Image Interpretation, Computer-Assisted
- Image Enhancement
- Fourier Analysis
- Computer Simulation
- Algorithms
- 5102 Atomic, molecular and optical physics
- 4009 Electronics, sensors and digital hardware
Citation

Published In
DOI
EISSN
ISSN
Publication Date
Volume
Issue
Start / End Page
Related Subject Headings
- Optics
- Models, Theoretical
- Microscopy
- Image Interpretation, Computer-Assisted
- Image Enhancement
- Fourier Analysis
- Computer Simulation
- Algorithms
- 5102 Atomic, molecular and optical physics
- 4009 Electronics, sensors and digital hardware