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Quantitative phase imaging via Fourier ptychographic microscopy.

Publication ,  Journal Article
Ou, X; Horstmeyer, R; Yang, C; Zheng, G
Published in: Optics letters
November 2013

Fourier ptychographic microscopy (FPM) is a recently developed imaging modality that uses angularly varying illumination to extend a system's performance beyond the limit defined by its optical components. The FPM technique applies a novel phase-retrieval procedure to achieve resolution enhancement and complex image recovery. In this Letter, we compare FPM data to theoretical prediction and phase-shifting digital holography measurement to show that its acquired phase maps are quantitative and artifact-free. We additionally explore the relationship between the achievable spatial and optical thickness resolution offered by a reconstructed FPM phase image. We conclude by demonstrating enhanced visualization and the collection of otherwise unobservable sample information using FPM's quantitative phase.

Duke Scholars

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Published In

Optics letters

DOI

EISSN

1539-4794

ISSN

0146-9592

Publication Date

November 2013

Volume

38

Issue

22

Start / End Page

4845 / 4848

Related Subject Headings

  • Signal Processing, Computer-Assisted
  • Optics
  • Microscopy, Phase-Contrast
  • Image Enhancement
  • Fourier Analysis
  • Equipment Failure Analysis
  • Equipment Design
  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering
 

Citation

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Ou, X., Horstmeyer, R., Yang, C., & Zheng, G. (2013). Quantitative phase imaging via Fourier ptychographic microscopy. Optics Letters, 38(22), 4845–4848. https://doi.org/10.1364/ol.38.004845
Ou, Xiaoze, Roarke Horstmeyer, Changhuei Yang, and Guoan Zheng. “Quantitative phase imaging via Fourier ptychographic microscopy.Optics Letters 38, no. 22 (November 2013): 4845–48. https://doi.org/10.1364/ol.38.004845.
Ou X, Horstmeyer R, Yang C, Zheng G. Quantitative phase imaging via Fourier ptychographic microscopy. Optics letters. 2013 Nov;38(22):4845–8.
Ou, Xiaoze, et al. “Quantitative phase imaging via Fourier ptychographic microscopy.Optics Letters, vol. 38, no. 22, Nov. 2013, pp. 4845–48. Epmc, doi:10.1364/ol.38.004845.
Ou X, Horstmeyer R, Yang C, Zheng G. Quantitative phase imaging via Fourier ptychographic microscopy. Optics letters. 2013 Nov;38(22):4845–4848.
Journal cover image

Published In

Optics letters

DOI

EISSN

1539-4794

ISSN

0146-9592

Publication Date

November 2013

Volume

38

Issue

22

Start / End Page

4845 / 4848

Related Subject Headings

  • Signal Processing, Computer-Assisted
  • Optics
  • Microscopy, Phase-Contrast
  • Image Enhancement
  • Fourier Analysis
  • Equipment Failure Analysis
  • Equipment Design
  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering