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Characterization of spatially varying aberrations for wide field-of-view microscopy.

Publication ,  Journal Article
Zheng, G; Ou, X; Horstmeyer, R; Yang, C
Published in: Optics express
July 2013

We describe a simple and robust approach for characterizing the spatially varying pupil aberrations of microscopy systems. In our demonstration with a standard microscope, we derive the location-dependent pupil transfer functions by first capturing multiple intensity images at different defocus settings. Next, a generalized pattern search algorithm is applied to recover the complex pupil functions at ~350 different spatial locations over the entire field-of-view. Parameter fitting transforms these pupil functions into accurate 2D aberration maps. We further demonstrate how these aberration maps can be applied in a phase-retrieval based microscopy setup to compensate for spatially varying aberrations and to achieve diffraction-limited performance over the entire field-of-view. We believe that this easy-to-use spatially-varying pupil characterization method may facilitate new optical imaging strategies for a variety of wide field-of-view imaging platforms.

Duke Scholars

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Published In

Optics express

DOI

EISSN

1094-4087

ISSN

1094-4087

Publication Date

July 2013

Volume

21

Issue

13

Start / End Page

15131 / 15143

Related Subject Headings

  • Optics
  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering
  • 1005 Communications Technologies
  • 0906 Electrical and Electronic Engineering
  • 0205 Optical Physics
 

Citation

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Zheng, G., Ou, X., Horstmeyer, R., & Yang, C. (2013). Characterization of spatially varying aberrations for wide field-of-view microscopy. Optics Express, 21(13), 15131–15143. https://doi.org/10.1364/oe.21.015131
Zheng, Guoan, Xiaoze Ou, Roarke Horstmeyer, and Changhuei Yang. “Characterization of spatially varying aberrations for wide field-of-view microscopy.Optics Express 21, no. 13 (July 2013): 15131–43. https://doi.org/10.1364/oe.21.015131.
Zheng G, Ou X, Horstmeyer R, Yang C. Characterization of spatially varying aberrations for wide field-of-view microscopy. Optics express. 2013 Jul;21(13):15131–43.
Zheng, Guoan, et al. “Characterization of spatially varying aberrations for wide field-of-view microscopy.Optics Express, vol. 21, no. 13, July 2013, pp. 15131–43. Epmc, doi:10.1364/oe.21.015131.
Zheng G, Ou X, Horstmeyer R, Yang C. Characterization of spatially varying aberrations for wide field-of-view microscopy. Optics express. 2013 Jul;21(13):15131–15143.
Journal cover image

Published In

Optics express

DOI

EISSN

1094-4087

ISSN

1094-4087

Publication Date

July 2013

Volume

21

Issue

13

Start / End Page

15131 / 15143

Related Subject Headings

  • Optics
  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering
  • 1005 Communications Technologies
  • 0906 Electrical and Electronic Engineering
  • 0205 Optical Physics