Single-Particle Cryo-Electron Microscopy: Mathematical Theory, Computational Challenges, and Opportunities.
Publication
, Journal Article
Bendory, T; Bartesaghi, A; Singer, A
Published in: IEEE Signal Process. Mag.
2020
Duke Scholars
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IEEE Signal Process. Mag.
DOI
Publication Date
2020
Volume
37
Start / End Page
58 / 76
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Bendory, T., Bartesaghi, A., & Singer, A. (2020). Single-Particle Cryo-Electron Microscopy: Mathematical Theory, Computational Challenges, and Opportunities. IEEE Signal Process. Mag., 37, 58–76. https://doi.org/10.1109/MSP.2019.2957822
Bendory, Tamir, Alberto Bartesaghi, and Amit Singer. “Single-Particle Cryo-Electron Microscopy: Mathematical Theory, Computational Challenges, and Opportunities.” IEEE Signal Process. Mag. 37 (2020): 58–76. https://doi.org/10.1109/MSP.2019.2957822.
Bendory T, Bartesaghi A, Singer A. Single-Particle Cryo-Electron Microscopy: Mathematical Theory, Computational Challenges, and Opportunities. IEEE Signal Process Mag. 2020;37:58–76.
Bendory, Tamir, et al. “Single-Particle Cryo-Electron Microscopy: Mathematical Theory, Computational Challenges, and Opportunities.” IEEE Signal Process. Mag., vol. 37, 2020, pp. 58–76. Dblp, doi:10.1109/MSP.2019.2957822.
Bendory T, Bartesaghi A, Singer A. Single-Particle Cryo-Electron Microscopy: Mathematical Theory, Computational Challenges, and Opportunities. IEEE Signal Process Mag. 2020;37:58–76.
Published In
IEEE Signal Process. Mag.
DOI
Publication Date
2020
Volume
37
Start / End Page
58 / 76