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Projection-based statistical analysis of full-chip leakage power with non-log-normal distributions

Publication ,  Conference
Li, X; Le, J; Pileggi, LT
Published in: Proceedings - Design Automation Conference
January 1, 2006

In this paper we propose a novel projection-based algorithm to estimate the full-chip leakage power with consideration of both inter-die and intra-die process variations. Unlike many traditional approaches that rely on log-Normal approximations, the proposed algorithm applies a novel projection method to extract a low-rank quadratic model of the logarithm of the full-chip leakage current and, therefore, is not limited to log-Normal distributions. By exploring the underlying sparse structure of the problem, an efficient algorithm is developed to extract the non-log-Normal leakage distribution with linear computational complexity in circuit size. In addition, an incremental analysis algorithm is proposed to quickly update the leakage distribution after changes to a circuit are made. Our numerical examples in a commercial 90nm CMOS process demonstrate that the proposed algorithm provides 4x error reduction compared with the previously proposed log-Normal approximations, while achieving orders of magnitude more efficiency than a Monte Carlo analysis with 104 samples. Copyright 2006 ACM.

Duke Scholars

Published In

Proceedings - Design Automation Conference

DOI

ISSN

0738-100X

Publication Date

January 1, 2006

Start / End Page

103 / 108
 

Citation

APA
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ICMJE
MLA
NLM
Li, X., Le, J., & Pileggi, L. T. (2006). Projection-based statistical analysis of full-chip leakage power with non-log-normal distributions. In Proceedings - Design Automation Conference (pp. 103–108). https://doi.org/10.1145/1146909.1146941
Li, X., J. Le, and L. T. Pileggi. “Projection-based statistical analysis of full-chip leakage power with non-log-normal distributions.” In Proceedings - Design Automation Conference, 103–8, 2006. https://doi.org/10.1145/1146909.1146941.
Li X, Le J, Pileggi LT. Projection-based statistical analysis of full-chip leakage power with non-log-normal distributions. In: Proceedings - Design Automation Conference. 2006. p. 103–8.
Li, X., et al. “Projection-based statistical analysis of full-chip leakage power with non-log-normal distributions.” Proceedings - Design Automation Conference, 2006, pp. 103–08. Scopus, doi:10.1145/1146909.1146941.
Li X, Le J, Pileggi LT. Projection-based statistical analysis of full-chip leakage power with non-log-normal distributions. Proceedings - Design Automation Conference. 2006. p. 103–108.

Published In

Proceedings - Design Automation Conference

DOI

ISSN

0738-100X

Publication Date

January 1, 2006

Start / End Page

103 / 108