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Correlated Rare Failure Analysis via Asymptotic Probability Evaluation

Publication ,  Journal Article
Tao, J; Yu, H; Su, Y; Zhou, D; Zeng, X; Li, X
Published in: IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems
April 1, 2022

In this article, a novel asymptotic probability evaluation (APE) method is proposed to estimate the probability of correlated rare failure events for complex integrated systems containing a large number of replicated cells. The key idea is to approximate the failure rate of the entire system by solving a set of nonlinear equations derived from a general analytical model. An error refinement method based on look-up table is further developed to improve numerical stability and, hence, reduce estimation error. Furthermore, a statistical algorithm based on resampling is developed to accurately estimate the confidence interval of APE. Our numerical experiments demonstrate that compared to the state-of-the-art method, APE can reduce the estimation error by up to 30\times without increasing the computational cost.

Duke Scholars

Published In

IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems

DOI

EISSN

1937-4151

ISSN

0278-0070

Publication Date

April 1, 2022

Volume

41

Issue

4

Start / End Page

813 / 826

Related Subject Headings

  • Computer Hardware & Architecture
  • 4607 Graphics, augmented reality and games
  • 4009 Electronics, sensors and digital hardware
  • 1006 Computer Hardware
  • 0906 Electrical and Electronic Engineering
 

Citation

APA
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ICMJE
MLA
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Tao, J., Yu, H., Su, Y., Zhou, D., Zeng, X., & Li, X. (2022). Correlated Rare Failure Analysis via Asymptotic Probability Evaluation. IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems, 41(4), 813–826. https://doi.org/10.1109/TCAD.2021.3073075
Tao, J., H. Yu, Y. Su, D. Zhou, X. Zeng, and X. Li. “Correlated Rare Failure Analysis via Asymptotic Probability Evaluation.” IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems 41, no. 4 (April 1, 2022): 813–26. https://doi.org/10.1109/TCAD.2021.3073075.
Tao J, Yu H, Su Y, Zhou D, Zeng X, Li X. Correlated Rare Failure Analysis via Asymptotic Probability Evaluation. IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems. 2022 Apr 1;41(4):813–26.
Tao, J., et al. “Correlated Rare Failure Analysis via Asymptotic Probability Evaluation.” IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems, vol. 41, no. 4, Apr. 2022, pp. 813–26. Scopus, doi:10.1109/TCAD.2021.3073075.
Tao J, Yu H, Su Y, Zhou D, Zeng X, Li X. Correlated Rare Failure Analysis via Asymptotic Probability Evaluation. IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems. 2022 Apr 1;41(4):813–826.

Published In

IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems

DOI

EISSN

1937-4151

ISSN

0278-0070

Publication Date

April 1, 2022

Volume

41

Issue

4

Start / End Page

813 / 826

Related Subject Headings

  • Computer Hardware & Architecture
  • 4607 Graphics, augmented reality and games
  • 4009 Electronics, sensors and digital hardware
  • 1006 Computer Hardware
  • 0906 Electrical and Electronic Engineering