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Correlated Rare Failure Analysis via Asymptotic Probability Evaluation

Publication ,  Journal Article
Tao, J; Yu, H; Su, Y; Zhou, D; Zeng, X; Li, X
Published in: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
April 1, 2022

In this article, a novel asymptotic probability evaluation (APE) method is proposed to estimate the probability of correlated rare failure events for complex integrated systems containing a large number of replicated cells. The key idea is to approximate the failure rate of the entire system by solving a set of nonlinear equations derived from a general analytical model. An error refinement method based on look-up table is further developed to improve numerical stability and, hence, reduce estimation error. Furthermore, a statistical algorithm based on resampling is developed to accurately estimate the confidence interval of APE. Our numerical experiments demonstrate that compared to the state-of-the-art method, APE can reduce the estimation error by up to 30\times without increasing the computational cost.

Duke Scholars

Published In

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

DOI

EISSN

1937-4151

ISSN

0278-0070

Publication Date

April 1, 2022

Volume

41

Issue

4

Start / End Page

813 / 826

Related Subject Headings

  • Computer Hardware & Architecture
  • 4607 Graphics, augmented reality and games
  • 4009 Electronics, sensors and digital hardware
  • 1006 Computer Hardware
  • 0906 Electrical and Electronic Engineering
 

Citation

APA
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ICMJE
MLA
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Tao, J., Yu, H., Su, Y., Zhou, D., Zeng, X., & Li, X. (2022). Correlated Rare Failure Analysis via Asymptotic Probability Evaluation. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 41(4), 813–826. https://doi.org/10.1109/TCAD.2021.3073075
Tao, J., H. Yu, Y. Su, D. Zhou, X. Zeng, and X. Li. “Correlated Rare Failure Analysis via Asymptotic Probability Evaluation.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 41, no. 4 (April 1, 2022): 813–26. https://doi.org/10.1109/TCAD.2021.3073075.
Tao J, Yu H, Su Y, Zhou D, Zeng X, Li X. Correlated Rare Failure Analysis via Asymptotic Probability Evaluation. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 2022 Apr 1;41(4):813–26.
Tao, J., et al. “Correlated Rare Failure Analysis via Asymptotic Probability Evaluation.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 41, no. 4, Apr. 2022, pp. 813–26. Scopus, doi:10.1109/TCAD.2021.3073075.
Tao J, Yu H, Su Y, Zhou D, Zeng X, Li X. Correlated Rare Failure Analysis via Asymptotic Probability Evaluation. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 2022 Apr 1;41(4):813–826.

Published In

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

DOI

EISSN

1937-4151

ISSN

0278-0070

Publication Date

April 1, 2022

Volume

41

Issue

4

Start / End Page

813 / 826

Related Subject Headings

  • Computer Hardware & Architecture
  • 4607 Graphics, augmented reality and games
  • 4009 Electronics, sensors and digital hardware
  • 1006 Computer Hardware
  • 0906 Electrical and Electronic Engineering