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Unsupervised root-cause analysis with transfer learning for integrated systems

Publication ,  Conference
Pan, R; Li, X; Chakrabarty, K
Published in: Proceedings of the IEEE VLSI Test Symposium
April 25, 2021

The increasing complexity of integrated systems has exacerbated the problems associated with root-cause analysis. Leveraging advances artificial intelligence, a large amount of intelligent root-cause-analysis methods have been proposed in recent years. However, most of these methods rely on root-cause labels from repair history for defective samples, which are often expensive to obtain. In this paper, we propose an unsupervised root-cause-analysis method that utilizes transfer learning. A two-stage clustering method is first developed by exploiting model selection based on the concept of Silhouette score. Next, a data-selection method based on ensemble learning is proposed to transfer valuable information from a source product to improve the root-cause-analysis accuracy on the target product with insufficient data. Two case studies based on industry designs demonstrate that the proposed approach significantly outperforms other state-of-the-art unsupervised root-cause-analysis methods.

Duke Scholars

Published In

Proceedings of the IEEE VLSI Test Symposium

DOI

Publication Date

April 25, 2021

Volume

2021-April
 

Citation

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Pan, R., Li, X., & Chakrabarty, K. (2021). Unsupervised root-cause analysis with transfer learning for integrated systems. In Proceedings of the IEEE VLSI Test Symposium (Vol. 2021-April). https://doi.org/10.1109/VTS50974.2021.9441030
Pan, R., X. Li, and K. Chakrabarty. “Unsupervised root-cause analysis with transfer learning for integrated systems.” In Proceedings of the IEEE VLSI Test Symposium, Vol. 2021-April, 2021. https://doi.org/10.1109/VTS50974.2021.9441030.
Pan R, Li X, Chakrabarty K. Unsupervised root-cause analysis with transfer learning for integrated systems. In: Proceedings of the IEEE VLSI Test Symposium. 2021.
Pan, R., et al. “Unsupervised root-cause analysis with transfer learning for integrated systems.” Proceedings of the IEEE VLSI Test Symposium, vol. 2021-April, 2021. Scopus, doi:10.1109/VTS50974.2021.9441030.
Pan R, Li X, Chakrabarty K. Unsupervised root-cause analysis with transfer learning for integrated systems. Proceedings of the IEEE VLSI Test Symposium. 2021.

Published In

Proceedings of the IEEE VLSI Test Symposium

DOI

Publication Date

April 25, 2021

Volume

2021-April