Guest Editors' Introduction: Near-Memory and In-Memory Processing
Publication
, Journal Article
Li, HH; Alameldeen, AR; Mutlu, O
Published in: IEEE Design and Test
April 1, 2022
Duke Scholars
Published In
IEEE Design and Test
DOI
EISSN
2168-2364
ISSN
2168-2356
Publication Date
April 1, 2022
Volume
39
Issue
2
Start / End Page
46 / 47
Citation
APA
Chicago
ICMJE
MLA
NLM
Li, H. H., Alameldeen, A. R., & Mutlu, O. (2022). Guest Editors' Introduction: Near-Memory and In-Memory Processing. IEEE Design and Test, 39(2), 46–47. https://doi.org/10.1109/MDAT.2021.3124742
Li, H. H., A. R. Alameldeen, and O. Mutlu. “Guest Editors' Introduction: Near-Memory and In-Memory Processing.” IEEE Design and Test 39, no. 2 (April 1, 2022): 46–47. https://doi.org/10.1109/MDAT.2021.3124742.
Li HH, Alameldeen AR, Mutlu O. Guest Editors' Introduction: Near-Memory and In-Memory Processing. IEEE Design and Test. 2022 Apr 1;39(2):46–7.
Li, H. H., et al. “Guest Editors' Introduction: Near-Memory and In-Memory Processing.” IEEE Design and Test, vol. 39, no. 2, Apr. 2022, pp. 46–47. Scopus, doi:10.1109/MDAT.2021.3124742.
Li HH, Alameldeen AR, Mutlu O. Guest Editors' Introduction: Near-Memory and In-Memory Processing. IEEE Design and Test. 2022 Apr 1;39(2):46–47.
Published In
IEEE Design and Test
DOI
EISSN
2168-2364
ISSN
2168-2356
Publication Date
April 1, 2022
Volume
39
Issue
2
Start / End Page
46 / 47