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Unsupervised Two-Stage Root-Cause Analysis With Transfer Learning for Integrated Systems

Publication ,  Journal Article
Pan, R; Li, X; Chakrabarty, K
Published in: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
February 1, 2023

The growing complexity of integrated systems makes root-cause analysis increasingly difficult. To address this challenge, advances in machine learning (ML) have been leveraged in recent years to design ML-based techniques for root-cause analysis. However, most of these methods require root-cause labels for defective samples obtained based on the analysis by human experts. In this article, we propose a multialgorithm two-stage clustering method with transfer learning for unsupervised root-cause analysis. First, a two-stage clustering method is proposed by applying multiple clustering methods to accommodate both numerical and categorical data and leveraging Silhouette score for model selection. Next, a double-bootstrapping method is proposed for data selection, transferring valuable information from a source product to a target product with insufficient data. In the first bootstrapping step, a random forest model is built to select effective source data. In the second bootstrapping step, clustering ensemble is applied to two-stage clustering to further improve the accuracy for root-cause analysis. Two case studies based on network products demonstrate the superior performance of the proposed approach compared to other state-of-the-art methods.

Duke Scholars

Published In

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

DOI

EISSN

1937-4151

ISSN

0278-0070

Publication Date

February 1, 2023

Volume

42

Issue

2

Start / End Page

497 / 508

Related Subject Headings

  • Computer Hardware & Architecture
  • 4607 Graphics, augmented reality and games
  • 4009 Electronics, sensors and digital hardware
  • 1006 Computer Hardware
  • 0906 Electrical and Electronic Engineering
 

Citation

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Pan, R., Li, X., & Chakrabarty, K. (2023). Unsupervised Two-Stage Root-Cause Analysis With Transfer Learning for Integrated Systems. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 42(2), 497–508. https://doi.org/10.1109/TCAD.2022.3176998
Pan, R., X. Li, and K. Chakrabarty. “Unsupervised Two-Stage Root-Cause Analysis With Transfer Learning for Integrated Systems.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 42, no. 2 (February 1, 2023): 497–508. https://doi.org/10.1109/TCAD.2022.3176998.
Pan R, Li X, Chakrabarty K. Unsupervised Two-Stage Root-Cause Analysis With Transfer Learning for Integrated Systems. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 2023 Feb 1;42(2):497–508.
Pan, R., et al. “Unsupervised Two-Stage Root-Cause Analysis With Transfer Learning for Integrated Systems.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 42, no. 2, Feb. 2023, pp. 497–508. Scopus, doi:10.1109/TCAD.2022.3176998.
Pan R, Li X, Chakrabarty K. Unsupervised Two-Stage Root-Cause Analysis With Transfer Learning for Integrated Systems. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 2023 Feb 1;42(2):497–508.

Published In

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

DOI

EISSN

1937-4151

ISSN

0278-0070

Publication Date

February 1, 2023

Volume

42

Issue

2

Start / End Page

497 / 508

Related Subject Headings

  • Computer Hardware & Architecture
  • 4607 Graphics, augmented reality and games
  • 4009 Electronics, sensors and digital hardware
  • 1006 Computer Hardware
  • 0906 Electrical and Electronic Engineering